Automatic testing method and device for interface
The application discloses an automatic testing method and device for an interface. The automatic testing method comprises the following steps: by adoption of testing equipment, in the program of the interface to be tested, determining a code segment without influencing a return value of the interfac...
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| creator | XU BINGSONG LUO SHIYAO DING LING |
| description | The application discloses an automatic testing method and device for an interface. The automatic testing method comprises the following steps: by adoption of testing equipment, in the program of the interface to be tested, determining a code segment without influencing a return value of the interface, generating a testing script for the code segment, and then executing the testing script to acquire the return value of the interface to be tested and a log corresponding to the code segment; then judging whether the acquired return value and the log conform to preset results, if so, determining that the working of the interface to be tested is normal, and if not, determining that the working of the interface to be tested is abnormal. The automatic testing method and device disclosed by the application have the advantages that since the testing equipment not only checks whether the return value is correct, but also checks whether the working of the code segment without influencing on the return value of the interface is normal in the program of the interface to be tested by the log, so that the interface to be tested can be accurately tested by the testing equipment. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN104360920A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN104360920A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN104360920A3</originalsourceid><addsrcrecordid>eNrjZDB0LC3Jz00syUxWKEktLsnMS1fITS3JyE9RSMxLUUhJLctMTlVIyy9SyMwrSS1KS0xO5WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFQCV5qSXxzn6GBibGZgaWRgaOxsSoAQCPziuL</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Automatic testing method and device for interface</title><source>esp@cenet</source><creator>XU BINGSONG ; LUO SHIYAO ; DING LING</creator><creatorcontrib>XU BINGSONG ; LUO SHIYAO ; DING LING</creatorcontrib><description>The application discloses an automatic testing method and device for an interface. The automatic testing method comprises the following steps: by adoption of testing equipment, in the program of the interface to be tested, determining a code segment without influencing a return value of the interface, generating a testing script for the code segment, and then executing the testing script to acquire the return value of the interface to be tested and a log corresponding to the code segment; then judging whether the acquired return value and the log conform to preset results, if so, determining that the working of the interface to be tested is normal, and if not, determining that the working of the interface to be tested is abnormal. The automatic testing method and device disclosed by the application have the advantages that since the testing equipment not only checks whether the return value is correct, but also checks whether the working of the code segment without influencing on the return value of the interface is normal in the program of the interface to be tested by the log, so that the interface to be tested can be accurately tested by the testing equipment.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS</subject><creationdate>2015</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20150218&DB=EPODOC&CC=CN&NR=104360920A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20150218&DB=EPODOC&CC=CN&NR=104360920A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>XU BINGSONG</creatorcontrib><creatorcontrib>LUO SHIYAO</creatorcontrib><creatorcontrib>DING LING</creatorcontrib><title>Automatic testing method and device for interface</title><description>The application discloses an automatic testing method and device for an interface. The automatic testing method comprises the following steps: by adoption of testing equipment, in the program of the interface to be tested, determining a code segment without influencing a return value of the interface, generating a testing script for the code segment, and then executing the testing script to acquire the return value of the interface to be tested and a log corresponding to the code segment; then judging whether the acquired return value and the log conform to preset results, if so, determining that the working of the interface to be tested is normal, and if not, determining that the working of the interface to be tested is abnormal. The automatic testing method and device disclosed by the application have the advantages that since the testing equipment not only checks whether the return value is correct, but also checks whether the working of the code segment without influencing on the return value of the interface is normal in the program of the interface to be tested by the log, so that the interface to be tested can be accurately tested by the testing equipment.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2015</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDB0LC3Jz00syUxWKEktLsnMS1fITS3JyE9RSMxLUUhJLctMTlVIyy9SyMwrSS1KS0xO5WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFQCV5qSXxzn6GBibGZgaWRgaOxsSoAQCPziuL</recordid><startdate>20150218</startdate><enddate>20150218</enddate><creator>XU BINGSONG</creator><creator>LUO SHIYAO</creator><creator>DING LING</creator><scope>EVB</scope></search><sort><creationdate>20150218</creationdate><title>Automatic testing method and device for interface</title><author>XU BINGSONG ; LUO SHIYAO ; DING LING</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN104360920A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2015</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>XU BINGSONG</creatorcontrib><creatorcontrib>LUO SHIYAO</creatorcontrib><creatorcontrib>DING LING</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>XU BINGSONG</au><au>LUO SHIYAO</au><au>DING LING</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Automatic testing method and device for interface</title><date>2015-02-18</date><risdate>2015</risdate><abstract>The application discloses an automatic testing method and device for an interface. The automatic testing method comprises the following steps: by adoption of testing equipment, in the program of the interface to be tested, determining a code segment without influencing a return value of the interface, generating a testing script for the code segment, and then executing the testing script to acquire the return value of the interface to be tested and a log corresponding to the code segment; then judging whether the acquired return value and the log conform to preset results, if so, determining that the working of the interface to be tested is normal, and if not, determining that the working of the interface to be tested is abnormal. The automatic testing method and device disclosed by the application have the advantages that since the testing equipment not only checks whether the return value is correct, but also checks whether the working of the code segment without influencing on the return value of the interface is normal in the program of the interface to be tested by the log, so that the interface to be tested can be accurately tested by the testing equipment.</abstract><oa>free_for_read</oa></addata></record> |
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| language | eng |
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| subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS |
| title | Automatic testing method and device for interface |
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