Monitoring and Controlling Temperatures in Semiconductor Structure

Monitoring and Controlling Temperatures in Semiconductor Structure

An electronic device includes a semiconductor structure. A first temperature sensor is located at a hot spot of the semiconductor structure and a second temperature sensor is located at a cold spot of the semiconductor structure. A control block is configured to control current flow through the semi...

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1. Verfasser: KARTAL VELI
Format: Patent
Sprache:eng
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BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
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description An electronic device includes a semiconductor structure. A first temperature sensor is located at a hot spot of the semiconductor structure and a second temperature sensor is located at a cold spot of the semiconductor structure. A control block is configured to control current flow through the semiconductor structure. For example, the control block is configured to cut off the current flow through the semiconductor structure when a temperature at the hot spot exceeds a first predefined threshold or when a temperature difference between the temperature at the hot spot and a temperature at the cold spot exceeds a second predefined threshold.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN104347446A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN104347446A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN104347446A3</originalsourceid><addsrcrecordid>eNrjZHDyzc_LLMkvysxLV0jMS1Fwzs8rKcrPyQHxQ1JzC1KLEktKi1KLFTLzFIJTczOT8_NSSpOBGhSCS4qADKAcDwNrWmJOcSovlOZmUHRzDXH20E0tyI9PLS5ITE7NSy2Jd_YzNDAxNjE3MTFzNCZGDQCYSDLX</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Monitoring and Controlling Temperatures in Semiconductor Structure</title><source>esp@cenet</source><creator>KARTAL VELI</creator><creatorcontrib>KARTAL VELI</creatorcontrib><description>An electronic device includes a semiconductor structure. A first temperature sensor is located at a hot spot of the semiconductor structure and a second temperature sensor is located at a cold spot of the semiconductor structure. A control block is configured to control current flow through the semiconductor structure. For example, the control block is configured to cut off the current flow through the semiconductor structure when a temperature at the hot spot exceeds a first predefined threshold or when a temperature difference between the temperature at the hot spot and a temperature at the cold spot exceeds a second predefined threshold.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2015</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20150211&amp;DB=EPODOC&amp;CC=CN&amp;NR=104347446A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20150211&amp;DB=EPODOC&amp;CC=CN&amp;NR=104347446A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KARTAL VELI</creatorcontrib><title>Monitoring and Controlling Temperatures in Semiconductor Structure</title><description>An electronic device includes a semiconductor structure. A first temperature sensor is located at a hot spot of the semiconductor structure and a second temperature sensor is located at a cold spot of the semiconductor structure. A control block is configured to control current flow through the semiconductor structure. For example, the control block is configured to cut off the current flow through the semiconductor structure when a temperature at the hot spot exceeds a first predefined threshold or when a temperature difference between the temperature at the hot spot and a temperature at the cold spot exceeds a second predefined threshold.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2015</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHDyzc_LLMkvysxLV0jMS1Fwzs8rKcrPyQHxQ1JzC1KLEktKi1KLFTLzFIJTczOT8_NSSpOBGhSCS4qADKAcDwNrWmJOcSovlOZmUHRzDXH20E0tyI9PLS5ITE7NSy2Jd_YzNDAxNjE3MTFzNCZGDQCYSDLX</recordid><startdate>20150211</startdate><enddate>20150211</enddate><creator>KARTAL VELI</creator><scope>EVB</scope></search><sort><creationdate>20150211</creationdate><title>Monitoring and Controlling Temperatures in Semiconductor Structure</title><author>KARTAL VELI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN104347446A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2015</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>KARTAL VELI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KARTAL VELI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Monitoring and Controlling Temperatures in Semiconductor Structure</title><date>2015-02-11</date><risdate>2015</risdate><abstract>An electronic device includes a semiconductor structure. A first temperature sensor is located at a hot spot of the semiconductor structure and a second temperature sensor is located at a cold spot of the semiconductor structure. A control block is configured to control current flow through the semiconductor structure. For example, the control block is configured to cut off the current flow through the semiconductor structure when a temperature at the hot spot exceeds a first predefined threshold or when a temperature difference between the temperature at the hot spot and a temperature at the cold spot exceeds a second predefined threshold.</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
title Monitoring and Controlling Temperatures in Semiconductor Structure
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-31T23%3A00%3A14IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KARTAL%20VELI&rft.date=2015-02-11&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN104347446A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true