Improved automatic glass stress detecting device

Improved automatic glass stress detecting device

The invention discloses an improved automatic glass stress detecting device. The improved automatic glass stress detecting device comprises a polarizer, an analyzer and a detection eyepiece, wherein the polarizer is mounted on the upper surface of a base; an LED light source is further arranged at t...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: SHANG XIUXIN
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator SHANG XIUXIN
description The invention discloses an improved automatic glass stress detecting device. The improved automatic glass stress detecting device comprises a polarizer, an analyzer and a detection eyepiece, wherein the polarizer is mounted on the upper surface of a base; an LED light source is further arranged at the position, below the polarizer, on the base and is connected to a brightness regulator arranged at one side of the base; a sample fixing device is further arranged at the position, above the polarizer, on the base. The detection accuracy is high, the test brightness can be controlled by virtue of the LED light source arranged on the base, and the accuracy of a measurement result is improved; moreover, a tested sample can be fixed by the sample fixing device, and measurement errors caused by product movement under the inclined test environment are prevented.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN104330360A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN104330360A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN104330360A3</originalsourceid><addsrcrecordid>eNrjZDDwzC0oyi9LTVFILC3Jz00syUxWSM9JLC5WKC4pSgVSKaklqcklmXnpQFZZZnIqDwNrWmJOcSovlOZmUHRzDXH20E0tyI9PLS5ITE7NSy2Jd_YzNDAxNjYwNjNwNCZGDQCK0iuR</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Improved automatic glass stress detecting device</title><source>esp@cenet</source><creator>SHANG XIUXIN</creator><creatorcontrib>SHANG XIUXIN</creatorcontrib><description>The invention discloses an improved automatic glass stress detecting device. The improved automatic glass stress detecting device comprises a polarizer, an analyzer and a detection eyepiece, wherein the polarizer is mounted on the upper surface of a base; an LED light source is further arranged at the position, below the polarizer, on the base and is connected to a brightness regulator arranged at one side of the base; a sample fixing device is further arranged at the position, above the polarizer, on the base. The detection accuracy is high, the test brightness can be controlled by virtue of the LED light source arranged on the base, and the accuracy of a measurement result is improved; moreover, a tested sample can be fixed by the sample fixing device, and measurement errors caused by product movement under the inclined test environment are prevented.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2015</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20150204&amp;DB=EPODOC&amp;CC=CN&amp;NR=104330360A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20150204&amp;DB=EPODOC&amp;CC=CN&amp;NR=104330360A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SHANG XIUXIN</creatorcontrib><title>Improved automatic glass stress detecting device</title><description>The invention discloses an improved automatic glass stress detecting device. The improved automatic glass stress detecting device comprises a polarizer, an analyzer and a detection eyepiece, wherein the polarizer is mounted on the upper surface of a base; an LED light source is further arranged at the position, below the polarizer, on the base and is connected to a brightness regulator arranged at one side of the base; a sample fixing device is further arranged at the position, above the polarizer, on the base. The detection accuracy is high, the test brightness can be controlled by virtue of the LED light source arranged on the base, and the accuracy of a measurement result is improved; moreover, a tested sample can be fixed by the sample fixing device, and measurement errors caused by product movement under the inclined test environment are prevented.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2015</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDDwzC0oyi9LTVFILC3Jz00syUxWSM9JLC5WKC4pSgVSKaklqcklmXnpQFZZZnIqDwNrWmJOcSovlOZmUHRzDXH20E0tyI9PLS5ITE7NSy2Jd_YzNDAxNjYwNjNwNCZGDQCK0iuR</recordid><startdate>20150204</startdate><enddate>20150204</enddate><creator>SHANG XIUXIN</creator><scope>EVB</scope></search><sort><creationdate>20150204</creationdate><title>Improved automatic glass stress detecting device</title><author>SHANG XIUXIN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN104330360A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2015</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SHANG XIUXIN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SHANG XIUXIN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Improved automatic glass stress detecting device</title><date>2015-02-04</date><risdate>2015</risdate><abstract>The invention discloses an improved automatic glass stress detecting device. The improved automatic glass stress detecting device comprises a polarizer, an analyzer and a detection eyepiece, wherein the polarizer is mounted on the upper surface of a base; an LED light source is further arranged at the position, below the polarizer, on the base and is connected to a brightness regulator arranged at one side of the base; a sample fixing device is further arranged at the position, above the polarizer, on the base. The detection accuracy is high, the test brightness can be controlled by virtue of the LED light source arranged on the base, and the accuracy of a measurement result is improved; moreover, a tested sample can be fixed by the sample fixing device, and measurement errors caused by product movement under the inclined test environment are prevented.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_CN104330360A
source esp@cenet
subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Improved automatic glass stress detecting device
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-02T13%3A26%3A30IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=SHANG%20XIUXIN&rft.date=2015-02-04&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN104330360A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true