Damage-free visible-near infrared light spectrum detecting method

Damage-free visible-near infrared light spectrum detecting method

The invention discloses a damage-free visible-near infrared light spectrum detecting method. The method discloses an integrated algorithm based on light spectrum preprocessing model screening, wavelength model screening and light spectrum detection analytic parameter screening, synthesizes the funct...

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Hauptverfasser: PAN TAO, SHI BENSHAN, CHEN JIEMEI, GUO HAOSONG, XIAO QINGQING
Format: Patent
Sprache:chi ; eng
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator PAN TAO
SHI BENSHAN
CHEN JIEMEI
GUO HAOSONG
XIAO QINGQING
description The invention discloses a damage-free visible-near infrared light spectrum detecting method. The method discloses an integrated algorithm based on light spectrum preprocessing model screening, wavelength model screening and light spectrum detection analytic parameter screening, synthesizes the functions of denoising, data dimension reduction, feature extraction, classification, identification and the like, obtains high-precision light spectrum identifying effects through random sampling inspection, demonstrates the feasibility of application of visible-near infrared diffuse reflection spectrums to transgenic sugarcane breeding screening and provides an effective solution to development of the damage-free transgenic sugarcane leaf detecting technology and design of related special spectrum instruments. The damage-free visible-near infrared light spectrum detecting method omits reagents, is damage-free, accurate, convenient, rapid and cost-saving and is a potential easily-applied detecting tool.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN104215591A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN104215591A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN104215591A3</originalsourceid><addsrcrecordid>eNrjZHB0ScxNTE_VTStKTVUoyyzOTMpJ1c1LTSxSyMxLK0osSk1RyMlMzyhRKC5ITS4pKs1VSEktAbIy89IVclNLMvJTeBhY0xJzilN5oTQ3g6Kba4izh25qQX58anFBYnJqXmpJvLOfoYGJkaGpqaWhozExagAFsDG9</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Damage-free visible-near infrared light spectrum detecting method</title><source>esp@cenet</source><creator>PAN TAO ; SHI BENSHAN ; CHEN JIEMEI ; GUO HAOSONG ; XIAO QINGQING</creator><creatorcontrib>PAN TAO ; SHI BENSHAN ; CHEN JIEMEI ; GUO HAOSONG ; XIAO QINGQING</creatorcontrib><description>The invention discloses a damage-free visible-near infrared light spectrum detecting method. The method discloses an integrated algorithm based on light spectrum preprocessing model screening, wavelength model screening and light spectrum detection analytic parameter screening, synthesizes the functions of denoising, data dimension reduction, feature extraction, classification, identification and the like, obtains high-precision light spectrum identifying effects through random sampling inspection, demonstrates the feasibility of application of visible-near infrared diffuse reflection spectrums to transgenic sugarcane breeding screening and provides an effective solution to development of the damage-free transgenic sugarcane leaf detecting technology and design of related special spectrum instruments. The damage-free visible-near infrared light spectrum detecting method omits reagents, is damage-free, accurate, convenient, rapid and cost-saving and is a potential easily-applied detecting tool.</description><language>chi ; eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2014</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20141217&amp;DB=EPODOC&amp;CC=CN&amp;NR=104215591A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20141217&amp;DB=EPODOC&amp;CC=CN&amp;NR=104215591A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>PAN TAO</creatorcontrib><creatorcontrib>SHI BENSHAN</creatorcontrib><creatorcontrib>CHEN JIEMEI</creatorcontrib><creatorcontrib>GUO HAOSONG</creatorcontrib><creatorcontrib>XIAO QINGQING</creatorcontrib><title>Damage-free visible-near infrared light spectrum detecting method</title><description>The invention discloses a damage-free visible-near infrared light spectrum detecting method. The method discloses an integrated algorithm based on light spectrum preprocessing model screening, wavelength model screening and light spectrum detection analytic parameter screening, synthesizes the functions of denoising, data dimension reduction, feature extraction, classification, identification and the like, obtains high-precision light spectrum identifying effects through random sampling inspection, demonstrates the feasibility of application of visible-near infrared diffuse reflection spectrums to transgenic sugarcane breeding screening and provides an effective solution to development of the damage-free transgenic sugarcane leaf detecting technology and design of related special spectrum instruments. The damage-free visible-near infrared light spectrum detecting method omits reagents, is damage-free, accurate, convenient, rapid and cost-saving and is a potential easily-applied detecting tool.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2014</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHB0ScxNTE_VTStKTVUoyyzOTMpJ1c1LTSxSyMxLK0osSk1RyMlMzyhRKC5ITS4pKs1VSEktAbIy89IVclNLMvJTeBhY0xJzilN5oTQ3g6Kba4izh25qQX58anFBYnJqXmpJvLOfoYGJkaGpqaWhozExagAFsDG9</recordid><startdate>20141217</startdate><enddate>20141217</enddate><creator>PAN TAO</creator><creator>SHI BENSHAN</creator><creator>CHEN JIEMEI</creator><creator>GUO HAOSONG</creator><creator>XIAO QINGQING</creator><scope>EVB</scope></search><sort><creationdate>20141217</creationdate><title>Damage-free visible-near infrared light spectrum detecting method</title><author>PAN TAO ; SHI BENSHAN ; CHEN JIEMEI ; GUO HAOSONG ; XIAO QINGQING</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN104215591A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2014</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>PAN TAO</creatorcontrib><creatorcontrib>SHI BENSHAN</creatorcontrib><creatorcontrib>CHEN JIEMEI</creatorcontrib><creatorcontrib>GUO HAOSONG</creatorcontrib><creatorcontrib>XIAO QINGQING</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>PAN TAO</au><au>SHI BENSHAN</au><au>CHEN JIEMEI</au><au>GUO HAOSONG</au><au>XIAO QINGQING</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Damage-free visible-near infrared light spectrum detecting method</title><date>2014-12-17</date><risdate>2014</risdate><abstract>The invention discloses a damage-free visible-near infrared light spectrum detecting method. The method discloses an integrated algorithm based on light spectrum preprocessing model screening, wavelength model screening and light spectrum detection analytic parameter screening, synthesizes the functions of denoising, data dimension reduction, feature extraction, classification, identification and the like, obtains high-precision light spectrum identifying effects through random sampling inspection, demonstrates the feasibility of application of visible-near infrared diffuse reflection spectrums to transgenic sugarcane breeding screening and provides an effective solution to development of the damage-free transgenic sugarcane leaf detecting technology and design of related special spectrum instruments. The damage-free visible-near infrared light spectrum detecting method omits reagents, is damage-free, accurate, convenient, rapid and cost-saving and is a potential easily-applied detecting tool.</abstract><oa>free_for_read</oa></addata></record>
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Damage-free visible-near infrared light spectrum detecting method
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-05T14%3A28%3A33IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=PAN%20TAO&rft.date=2014-12-17&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN104215591A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true