Analysis system, analysis device, management device, and computer program

In order to enable the registration of measurement parameters to be grasped on the management side in case the measurement parameters are erroneously registered, an analysis system (1) comprises an analysis device (100) which analyzes a sample in accordance with measurement parameters set for a reag...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	YAO SHUNSUKE, NISHIDA TAISUKE, KUWAOKA SHIRO
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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