Analysis system, analysis device, management device, and computer program

Analysis system, analysis device, management device, and computer program

In order to enable the registration of measurement parameters to be grasped on the management side in case the measurement parameters are erroneously registered, an analysis system (1) comprises an analysis device (100) which analyzes a sample in accordance with measurement parameters set for a reag...

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Hauptverfasser: YAO SHUNSUKE, NISHIDA TAISUKE, KUWAOKA SHIRO
Format: Patent
Sprache:chi ; eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator YAO SHUNSUKE
NISHIDA TAISUKE
KUWAOKA SHIRO
description In order to enable the registration of measurement parameters to be grasped on the management side in case the measurement parameters are erroneously registered, an analysis system (1) comprises an analysis device (100) which analyzes a sample in accordance with measurement parameters set for a reagent to be used, and a management device (200) which is connected to the analysis device to be communicable therewith via a network. The analysis device (100) is provided with a processing unit (120), and a transmission unit (126) which transmits information to the management device (200). The processing unit (120) enables the execution of processing for accepting the registration of the measurement parameters, and when the measurement parameters have been registered, executes processing for transmitting transmission information including information indicating that the measurement parameters have been registered from the transmission unit (126) to the management device (200).
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Analysis system, analysis device, management device, and computer program
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