Sampling and lofting device and sampling and lofting calibration method for satellite total leak rate testing
The invention discloses a sampling and lofting device used in the satellite total leak rate testing process. The device mainly comprises a cavity with the fixed volume. A transverse pipe and a longitudinal pipe are crossed and are communicated to the top of the cavity. The interior of the transverse...
Gespeichert in:
Hauptverfasser: | , , , , , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | LIU SHENG SHI LIXIA DING RAN FENG QI YANG DINGKUI HONG XIAOPENG |
description | The invention discloses a sampling and lofting device used in the satellite total leak rate testing process. The device mainly comprises a cavity with the fixed volume. A transverse pipe and a longitudinal pipe are crossed and are communicated to the top of the cavity. The interior of the transverse pipe and the interior of the longitudinal pipe are of a crossed communicated structure. The two ends of the transverse pipe are used as a gas sampling opening and a gas lofting opening respectively for total leak rate testing. The top of the longitudinal pipe is provided with a switch valve used for controlling gas inside the cavity to enter and get out of the transverse pipe in the sampling and lofting process, and an O-shaped sealing ring is arranged between the switch valve and the inner side of the longitudinal pipe to prevent gas from escaping from the upper end of the longitudinal pipe in the sampling and lofting process. The invention further provides a sampling and lofting calibration method for satellite |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN104089745A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN104089745A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN104089745A3</originalsourceid><addsrcrecordid>eNqNi88OATEQxntxELzDeADJihUcZUOcXLhvRjtLY9ppthPPryuODk7fv983NuGCIbGPd8DogKXTwTt6eUufKv_aLbK_9aheIgTShzjopC-sErNXAhVFBiZ8QsFKpjwcp2bUIWeafXVi5sfDtTktKElLOaGlSNo252VVV9vdpl7vV_8wb23gQkc</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Sampling and lofting device and sampling and lofting calibration method for satellite total leak rate testing</title><source>esp@cenet</source><creator>LIU SHENG ; SHI LIXIA ; DING RAN ; FENG QI ; YANG DINGKUI ; HONG XIAOPENG</creator><creatorcontrib>LIU SHENG ; SHI LIXIA ; DING RAN ; FENG QI ; YANG DINGKUI ; HONG XIAOPENG</creatorcontrib><description>The invention discloses a sampling and lofting device used in the satellite total leak rate testing process. The device mainly comprises a cavity with the fixed volume. A transverse pipe and a longitudinal pipe are crossed and are communicated to the top of the cavity. The interior of the transverse pipe and the interior of the longitudinal pipe are of a crossed communicated structure. The two ends of the transverse pipe are used as a gas sampling opening and a gas lofting opening respectively for total leak rate testing. The top of the longitudinal pipe is provided with a switch valve used for controlling gas inside the cavity to enter and get out of the transverse pipe in the sampling and lofting process, and an O-shaped sealing ring is arranged between the switch valve and the inner side of the longitudinal pipe to prevent gas from escaping from the upper end of the longitudinal pipe in the sampling and lofting process. The invention further provides a sampling and lofting calibration method for satellite</description><language>chi ; eng</language><subject>MEASURING ; PHYSICS ; TESTING ; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES ; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><creationdate>2014</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20141008&DB=EPODOC&CC=CN&NR=104089745A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20141008&DB=EPODOC&CC=CN&NR=104089745A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LIU SHENG</creatorcontrib><creatorcontrib>SHI LIXIA</creatorcontrib><creatorcontrib>DING RAN</creatorcontrib><creatorcontrib>FENG QI</creatorcontrib><creatorcontrib>YANG DINGKUI</creatorcontrib><creatorcontrib>HONG XIAOPENG</creatorcontrib><title>Sampling and lofting device and sampling and lofting calibration method for satellite total leak rate testing</title><description>The invention discloses a sampling and lofting device used in the satellite total leak rate testing process. The device mainly comprises a cavity with the fixed volume. A transverse pipe and a longitudinal pipe are crossed and are communicated to the top of the cavity. The interior of the transverse pipe and the interior of the longitudinal pipe are of a crossed communicated structure. The two ends of the transverse pipe are used as a gas sampling opening and a gas lofting opening respectively for total leak rate testing. The top of the longitudinal pipe is provided with a switch valve used for controlling gas inside the cavity to enter and get out of the transverse pipe in the sampling and lofting process, and an O-shaped sealing ring is arranged between the switch valve and the inner side of the longitudinal pipe to prevent gas from escaping from the upper end of the longitudinal pipe in the sampling and lofting process. The invention further provides a sampling and lofting calibration method for satellite</description><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><subject>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</subject><subject>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2014</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNi88OATEQxntxELzDeADJihUcZUOcXLhvRjtLY9ppthPPryuODk7fv983NuGCIbGPd8DogKXTwTt6eUufKv_aLbK_9aheIgTShzjopC-sErNXAhVFBiZ8QsFKpjwcp2bUIWeafXVi5sfDtTktKElLOaGlSNo252VVV9vdpl7vV_8wb23gQkc</recordid><startdate>20141008</startdate><enddate>20141008</enddate><creator>LIU SHENG</creator><creator>SHI LIXIA</creator><creator>DING RAN</creator><creator>FENG QI</creator><creator>YANG DINGKUI</creator><creator>HONG XIAOPENG</creator><scope>EVB</scope></search><sort><creationdate>20141008</creationdate><title>Sampling and lofting device and sampling and lofting calibration method for satellite total leak rate testing</title><author>LIU SHENG ; SHI LIXIA ; DING RAN ; FENG QI ; YANG DINGKUI ; HONG XIAOPENG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN104089745A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2014</creationdate><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><topic>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</topic><topic>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>LIU SHENG</creatorcontrib><creatorcontrib>SHI LIXIA</creatorcontrib><creatorcontrib>DING RAN</creatorcontrib><creatorcontrib>FENG QI</creatorcontrib><creatorcontrib>YANG DINGKUI</creatorcontrib><creatorcontrib>HONG XIAOPENG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LIU SHENG</au><au>SHI LIXIA</au><au>DING RAN</au><au>FENG QI</au><au>YANG DINGKUI</au><au>HONG XIAOPENG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Sampling and lofting device and sampling and lofting calibration method for satellite total leak rate testing</title><date>2014-10-08</date><risdate>2014</risdate><abstract>The invention discloses a sampling and lofting device used in the satellite total leak rate testing process. The device mainly comprises a cavity with the fixed volume. A transverse pipe and a longitudinal pipe are crossed and are communicated to the top of the cavity. The interior of the transverse pipe and the interior of the longitudinal pipe are of a crossed communicated structure. The two ends of the transverse pipe are used as a gas sampling opening and a gas lofting opening respectively for total leak rate testing. The top of the longitudinal pipe is provided with a switch valve used for controlling gas inside the cavity to enter and get out of the transverse pipe in the sampling and lofting process, and an O-shaped sealing ring is arranged between the switch valve and the inner side of the longitudinal pipe to prevent gas from escaping from the upper end of the longitudinal pipe in the sampling and lofting process. The invention further provides a sampling and lofting calibration method for satellite</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | chi ; eng |
recordid | cdi_epo_espacenet_CN104089745A |
source | esp@cenet |
subjects | MEASURING PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR |
title | Sampling and lofting device and sampling and lofting calibration method for satellite total leak rate testing |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-13T08%3A34%3A05IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=LIU%20SHENG&rft.date=2014-10-08&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN104089745A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |