Apparatus and method for quantitative test of defect in slender magnetic-conductive component

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	YIHUA KANG, RUI HUANG, KECHONG YANG
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

container_end_page
container_issue
container_start_page
container_title
container_volume
creator	YIHUA KANG RUI HUANG KECHONG YANG
description
format	Patent
fullrecord	<record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN1040797CC</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN1040797CC</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN1040797CC3</originalsourceid><addsrcrecordid>eNqNyzEKwkAQRuE0FqLeYS4QiCgES1kiVla2Eobdf3UhmVmzE8-viAewes33ltXtmDNPbHMhlkAj7KGBok70nFksGVt6gQzFSCMFRHijJFQGSMBEI98FlnztVcLsv9rrmFUgtq4WkYeCza-rik7d1Z1rZO1RMnt85t5dts2-aQ-tc7s_yBu2Qjxv</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Apparatus and method for quantitative test of defect in slender magnetic-conductive component</title><source>esp@cenet</source><creator>YIHUA KANG ; RUI HUANG ; KECHONG YANG</creator><creatorcontrib>YIHUA KANG ; RUI HUANG ; KECHONG YANG</creatorcontrib><edition>5</edition><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>1998</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19981118&DB=EPODOC&CC=CN&NR=1040797C$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19981118&DB=EPODOC&CC=CN&NR=1040797C$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>YIHUA KANG</creatorcontrib><creatorcontrib>RUI HUANG</creatorcontrib><creatorcontrib>KECHONG YANG</creatorcontrib><title>Apparatus and method for quantitative test of defect in slender magnetic-conductive component</title><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1998</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyzEKwkAQRuE0FqLeYS4QiCgES1kiVla2Eobdf3UhmVmzE8-viAewes33ltXtmDNPbHMhlkAj7KGBok70nFksGVt6gQzFSCMFRHijJFQGSMBEI98FlnztVcLsv9rrmFUgtq4WkYeCza-rik7d1Z1rZO1RMnt85t5dts2-aQ-tc7s_yBu2Qjxv</recordid><startdate>19981118</startdate><enddate>19981118</enddate><creator>YIHUA KANG</creator><creator>RUI HUANG</creator><creator>KECHONG YANG</creator><scope>EVB</scope></search><sort><creationdate>19981118</creationdate><title>Apparatus and method for quantitative test of defect in slender magnetic-conductive component</title><author>YIHUA KANG ; RUI HUANG ; KECHONG YANG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN1040797CC3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1998</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>YIHUA KANG</creatorcontrib><creatorcontrib>RUI HUANG</creatorcontrib><creatorcontrib>KECHONG YANG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>YIHUA KANG</au><au>RUI HUANG</au><au>KECHONG YANG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Apparatus and method for quantitative test of defect in slender magnetic-conductive component</title><date>1998-11-18</date><risdate>1998</risdate><edition>5</edition><oa>free_for_read</oa></addata></record>
fulltext	fulltext_linktorsrc
identifier
ispartof
issn
language	eng
recordid	cdi_epo_espacenet_CN1040797CC
source	esp@cenet
subjects	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
title	Apparatus and method for quantitative test of defect in slender magnetic-conductive component
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-26T12%3A04%3A34IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=YIHUA%20KANG&rft.date=1998-11-18&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN1040797CC%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true