Discrete assembly backward traceability and semiconductor device forward traceability

Discrete assembly backward traceability and semiconductor device forward traceability

The invention discloses a system for providing backward and forward traceability through a method of identifying a discrete assembly (a bare core, a substrate and/or a passive element) in a semiconductor device. A technology used for generating a unique identifier is further included, the unique ide...

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Hauptverfasser: TUNG CHIHIANG, FRANK LU, DIDIER CHAVET, HEM TAKIAR, CHEEMAN YU, JIAMING SHI
Format: Patent
Sprache:chi ; eng
Schlagworte:
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
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creator TUNG CHIHIANG
FRANK LU
DIDIER CHAVET
HEM TAKIAR
CHEEMAN YU
JIAMING SHI
description The invention discloses a system for providing backward and forward traceability through a method of identifying a discrete assembly (a bare core, a substrate and/or a passive element) in a semiconductor device. A technology used for generating a unique identifier is further included, the unique identifier is used for marking the semiconductor device, and the semiconductor device and the discrete assembly in the device can be tracked and retrospected under the condition of each process and test in the process of producing the semiconductor device.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN104022058A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN104022058A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN104022058A3</originalsourceid><addsrcrecordid>eNrjZAh1ySxOLkotSVVILC5OzU3KqVRISkzOLk8sSlEoKUpMTk1MyszJLKlUSMxLUQAqyEzOz0spTS7JL1JISS3LTE5VSMsvwlDNw8CalphTnMoLpbkZFN1cQ5w9dFML8uNTiwuAKvNSS-Kd_QwNTAyMjAxMLRyNiVEDAEwDOgs</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Discrete assembly backward traceability and semiconductor device forward traceability</title><source>esp@cenet</source><creator>TUNG CHIHIANG ; FRANK LU ; DIDIER CHAVET ; HEM TAKIAR ; CHEEMAN YU ; JIAMING SHI</creator><creatorcontrib>TUNG CHIHIANG ; FRANK LU ; DIDIER CHAVET ; HEM TAKIAR ; CHEEMAN YU ; JIAMING SHI</creatorcontrib><description>The invention discloses a system for providing backward and forward traceability through a method of identifying a discrete assembly (a bare core, a substrate and/or a passive element) in a semiconductor device. A technology used for generating a unique identifier is further included, the unique identifier is used for marking the semiconductor device, and the semiconductor device and the discrete assembly in the device can be tracked and retrospected under the condition of each process and test in the process of producing the semiconductor device.</description><language>chi ; eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2014</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20140903&amp;DB=EPODOC&amp;CC=CN&amp;NR=104022058A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20140903&amp;DB=EPODOC&amp;CC=CN&amp;NR=104022058A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TUNG CHIHIANG</creatorcontrib><creatorcontrib>FRANK LU</creatorcontrib><creatorcontrib>DIDIER CHAVET</creatorcontrib><creatorcontrib>HEM TAKIAR</creatorcontrib><creatorcontrib>CHEEMAN YU</creatorcontrib><creatorcontrib>JIAMING SHI</creatorcontrib><title>Discrete assembly backward traceability and semiconductor device forward traceability</title><description>The invention discloses a system for providing backward and forward traceability through a method of identifying a discrete assembly (a bare core, a substrate and/or a passive element) in a semiconductor device. A technology used for generating a unique identifier is further included, the unique identifier is used for marking the semiconductor device, and the semiconductor device and the discrete assembly in the device can be tracked and retrospected under the condition of each process and test in the process of producing the semiconductor device.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2014</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZAh1ySxOLkotSVVILC5OzU3KqVRISkzOLk8sSlEoKUpMTk1MyszJLKlUSMxLUQAqyEzOz0spTS7JL1JISS3LTE5VSMsvwlDNw8CalphTnMoLpbkZFN1cQ5w9dFML8uNTiwuAKvNSS-Kd_QwNTAyMjAxMLRyNiVEDAEwDOgs</recordid><startdate>20140903</startdate><enddate>20140903</enddate><creator>TUNG CHIHIANG</creator><creator>FRANK LU</creator><creator>DIDIER CHAVET</creator><creator>HEM TAKIAR</creator><creator>CHEEMAN YU</creator><creator>JIAMING SHI</creator><scope>EVB</scope></search><sort><creationdate>20140903</creationdate><title>Discrete assembly backward traceability and semiconductor device forward traceability</title><author>TUNG CHIHIANG ; FRANK LU ; DIDIER CHAVET ; HEM TAKIAR ; CHEEMAN YU ; JIAMING SHI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN104022058A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2014</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>TUNG CHIHIANG</creatorcontrib><creatorcontrib>FRANK LU</creatorcontrib><creatorcontrib>DIDIER CHAVET</creatorcontrib><creatorcontrib>HEM TAKIAR</creatorcontrib><creatorcontrib>CHEEMAN YU</creatorcontrib><creatorcontrib>JIAMING SHI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TUNG CHIHIANG</au><au>FRANK LU</au><au>DIDIER CHAVET</au><au>HEM TAKIAR</au><au>CHEEMAN YU</au><au>JIAMING SHI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Discrete assembly backward traceability and semiconductor device forward traceability</title><date>2014-09-03</date><risdate>2014</risdate><abstract>The invention discloses a system for providing backward and forward traceability through a method of identifying a discrete assembly (a bare core, a substrate and/or a passive element) in a semiconductor device. A technology used for generating a unique identifier is further included, the unique identifier is used for marking the semiconductor device, and the semiconductor device and the discrete assembly in the device can be tracked and retrospected under the condition of each process and test in the process of producing the semiconductor device.</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
title Discrete assembly backward traceability and semiconductor device forward traceability
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-21T01%3A36%3A04IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=TUNG%20CHIHIANG&rft.date=2014-09-03&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN104022058A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true