High-frequency performance test structure for pluggable optical module connector

The invention relates to a high-frequency performance test structure for a pluggable optical module connector and relates to the field of high-frequency performance tests for the pluggable optical module connector. The high-frequency performance test structure for the pluggable optical module connec...

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Hauptverfasser: CHEN XIAOFENG, YANG BIAO, LI JIANGQUAN, ZOU CHONGZHEN
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creator CHEN XIAOFENG
YANG BIAO
LI JIANGQUAN
ZOU CHONGZHEN
description The invention relates to a high-frequency performance test structure for a pluggable optical module connector and relates to the field of high-frequency performance tests for the pluggable optical module connector. The high-frequency performance test structure for the pluggable optical module connector comprises a first PCB and a second PCB. The first PCB and the second PCB are both provided with coaxial connectors. The optical module connector to be tested is arranged on the first PCB and connected with the coaxial connector on the first PCB through a PCB copper clad laminate and a pin of a high-speed differential signal of the optical module connector is connected with the coaxial connector. A structural part is fixedly arranged on the second PCB, one end of the structural part is fixed to the second PCB, the other end of the structural part extends out of the second PCB and provided with gold fingers, the gold fingers are connected with the coaxial connector on the second PCB through a PCB copper clad lami
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN103983821A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN103983821A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN103983821A3</originalsourceid><addsrcrecordid>eNqNijEOwjAQBN1QIOAPxwMiEdyEEkWgVIiCPjLHOonk2MY-F_yeFDyAajSjWat7Nw1jZRPeBZ4_FJFsSLPxDBJkoSypsJQEWjpFV4bBPB0oRJnYOJrDqyzKwXuwhLRVK2tcxu7HjdpfL4-2qxBDjxwNw0P69lYf9KnRzbE-63-eLwflODY</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>High-frequency performance test structure for pluggable optical module connector</title><source>esp@cenet</source><creator>CHEN XIAOFENG ; YANG BIAO ; LI JIANGQUAN ; ZOU CHONGZHEN</creator><creatorcontrib>CHEN XIAOFENG ; YANG BIAO ; LI JIANGQUAN ; ZOU CHONGZHEN</creatorcontrib><description>The invention relates to a high-frequency performance test structure for a pluggable optical module connector and relates to the field of high-frequency performance tests for the pluggable optical module connector. The high-frequency performance test structure for the pluggable optical module connector comprises a first PCB and a second PCB. The first PCB and the second PCB are both provided with coaxial connectors. The optical module connector to be tested is arranged on the first PCB and connected with the coaxial connector on the first PCB through a PCB copper clad laminate and a pin of a high-speed differential signal of the optical module connector is connected with the coaxial connector. A structural part is fixedly arranged on the second PCB, one end of the structural part is fixed to the second PCB, the other end of the structural part extends out of the second PCB and provided with gold fingers, the gold fingers are connected with the coaxial connector on the second PCB through a PCB copper clad lami</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2014</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20140813&amp;DB=EPODOC&amp;CC=CN&amp;NR=103983821A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20140813&amp;DB=EPODOC&amp;CC=CN&amp;NR=103983821A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CHEN XIAOFENG</creatorcontrib><creatorcontrib>YANG BIAO</creatorcontrib><creatorcontrib>LI JIANGQUAN</creatorcontrib><creatorcontrib>ZOU CHONGZHEN</creatorcontrib><title>High-frequency performance test structure for pluggable optical module connector</title><description>The invention relates to a high-frequency performance test structure for a pluggable optical module connector and relates to the field of high-frequency performance tests for the pluggable optical module connector. The high-frequency performance test structure for the pluggable optical module connector comprises a first PCB and a second PCB. The first PCB and the second PCB are both provided with coaxial connectors. The optical module connector to be tested is arranged on the first PCB and connected with the coaxial connector on the first PCB through a PCB copper clad laminate and a pin of a high-speed differential signal of the optical module connector is connected with the coaxial connector. A structural part is fixedly arranged on the second PCB, one end of the structural part is fixed to the second PCB, the other end of the structural part extends out of the second PCB and provided with gold fingers, the gold fingers are connected with the coaxial connector on the second PCB through a PCB copper clad lami</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2014</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNijEOwjAQBN1QIOAPxwMiEdyEEkWgVIiCPjLHOonk2MY-F_yeFDyAajSjWat7Nw1jZRPeBZ4_FJFsSLPxDBJkoSypsJQEWjpFV4bBPB0oRJnYOJrDqyzKwXuwhLRVK2tcxu7HjdpfL4-2qxBDjxwNw0P69lYf9KnRzbE-63-eLwflODY</recordid><startdate>20140813</startdate><enddate>20140813</enddate><creator>CHEN XIAOFENG</creator><creator>YANG BIAO</creator><creator>LI JIANGQUAN</creator><creator>ZOU CHONGZHEN</creator><scope>EVB</scope></search><sort><creationdate>20140813</creationdate><title>High-frequency performance test structure for pluggable optical module connector</title><author>CHEN XIAOFENG ; YANG BIAO ; LI JIANGQUAN ; ZOU CHONGZHEN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN103983821A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2014</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>CHEN XIAOFENG</creatorcontrib><creatorcontrib>YANG BIAO</creatorcontrib><creatorcontrib>LI JIANGQUAN</creatorcontrib><creatorcontrib>ZOU CHONGZHEN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CHEN XIAOFENG</au><au>YANG BIAO</au><au>LI JIANGQUAN</au><au>ZOU CHONGZHEN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>High-frequency performance test structure for pluggable optical module connector</title><date>2014-08-13</date><risdate>2014</risdate><abstract>The invention relates to a high-frequency performance test structure for a pluggable optical module connector and relates to the field of high-frequency performance tests for the pluggable optical module connector. The high-frequency performance test structure for the pluggable optical module connector comprises a first PCB and a second PCB. The first PCB and the second PCB are both provided with coaxial connectors. The optical module connector to be tested is arranged on the first PCB and connected with the coaxial connector on the first PCB through a PCB copper clad laminate and a pin of a high-speed differential signal of the optical module connector is connected with the coaxial connector. A structural part is fixedly arranged on the second PCB, one end of the structural part is fixed to the second PCB, the other end of the structural part extends out of the second PCB and provided with gold fingers, the gold fingers are connected with the coaxial connector on the second PCB through a PCB copper clad lami</abstract><oa>free_for_read</oa></addata></record>
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title High-frequency performance test structure for pluggable optical module connector
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-27T05%3A18%3A26IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=CHEN%20XIAOFENG&rft.date=2014-08-13&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN103983821A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true