Test device for logic analyzer forward channel

The invention relates to the technical field of forward channel measurement, and especially relates to a signal test device for a logic analyzer forward channel. A sampling device for logic analyzer timing analysis, which is provided by the invention, comprises a signal attenuation module, an operat...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: SONG YUNQU, LV HUAPING
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator SONG YUNQU
LV HUAPING
description The invention relates to the technical field of forward channel measurement, and especially relates to a signal test device for a logic analyzer forward channel. A sampling device for logic analyzer timing analysis, which is provided by the invention, comprises a signal attenuation module, an operational amplifier U1, a comparator U2, a level converter U3, an operational amplifier U4, a threshold circuit and a logic forward channel circuit. The signal attenuation module is connected with the operational amplifier U1. The comparator U2 is respectively connected with the operational amplifier U1, the level converter U3 and the operational amplifier U4. The operational amplifier U4 is respectively connected with the threshold circuit and the logic forward channel circuit. According to the invention, the performance of an analyzer is improved.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN103713270A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN103713270A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN103713270A3</originalsourceid><addsrcrecordid>eNrjZNALSS0uUUhJLctMTlVIyy9SyMlPz0xWSMxLzKmsSi0CCZUnFqUoJGck5uWl5vAwsKYl5hSn8kJpbgZFN9cQZw_d1IL8-NTigsTk1LzUknhnP0MDY3NDYyNzA0djYtQAAOelKl4</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Test device for logic analyzer forward channel</title><source>esp@cenet</source><creator>SONG YUNQU ; LV HUAPING</creator><creatorcontrib>SONG YUNQU ; LV HUAPING</creatorcontrib><description>The invention relates to the technical field of forward channel measurement, and especially relates to a signal test device for a logic analyzer forward channel. A sampling device for logic analyzer timing analysis, which is provided by the invention, comprises a signal attenuation module, an operational amplifier U1, a comparator U2, a level converter U3, an operational amplifier U4, a threshold circuit and a logic forward channel circuit. The signal attenuation module is connected with the operational amplifier U1. The comparator U2 is respectively connected with the operational amplifier U1, the level converter U3 and the operational amplifier U4. The operational amplifier U4 is respectively connected with the threshold circuit and the logic forward channel circuit. According to the invention, the performance of an analyzer is improved.</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2014</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20140409&amp;DB=EPODOC&amp;CC=CN&amp;NR=103713270A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76516</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20140409&amp;DB=EPODOC&amp;CC=CN&amp;NR=103713270A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SONG YUNQU</creatorcontrib><creatorcontrib>LV HUAPING</creatorcontrib><title>Test device for logic analyzer forward channel</title><description>The invention relates to the technical field of forward channel measurement, and especially relates to a signal test device for a logic analyzer forward channel. A sampling device for logic analyzer timing analysis, which is provided by the invention, comprises a signal attenuation module, an operational amplifier U1, a comparator U2, a level converter U3, an operational amplifier U4, a threshold circuit and a logic forward channel circuit. The signal attenuation module is connected with the operational amplifier U1. The comparator U2 is respectively connected with the operational amplifier U1, the level converter U3 and the operational amplifier U4. The operational amplifier U4 is respectively connected with the threshold circuit and the logic forward channel circuit. According to the invention, the performance of an analyzer is improved.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2014</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNALSS0uUUhJLctMTlVIyy9SyMlPz0xWSMxLzKmsSi0CCZUnFqUoJGck5uWl5vAwsKYl5hSn8kJpbgZFN9cQZw_d1IL8-NTigsTk1LzUknhnP0MDY3NDYyNzA0djYtQAAOelKl4</recordid><startdate>20140409</startdate><enddate>20140409</enddate><creator>SONG YUNQU</creator><creator>LV HUAPING</creator><scope>EVB</scope></search><sort><creationdate>20140409</creationdate><title>Test device for logic analyzer forward channel</title><author>SONG YUNQU ; LV HUAPING</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN103713270A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2014</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SONG YUNQU</creatorcontrib><creatorcontrib>LV HUAPING</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SONG YUNQU</au><au>LV HUAPING</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Test device for logic analyzer forward channel</title><date>2014-04-09</date><risdate>2014</risdate><abstract>The invention relates to the technical field of forward channel measurement, and especially relates to a signal test device for a logic analyzer forward channel. A sampling device for logic analyzer timing analysis, which is provided by the invention, comprises a signal attenuation module, an operational amplifier U1, a comparator U2, a level converter U3, an operational amplifier U4, a threshold circuit and a logic forward channel circuit. The signal attenuation module is connected with the operational amplifier U1. The comparator U2 is respectively connected with the operational amplifier U1, the level converter U3 and the operational amplifier U4. The operational amplifier U4 is respectively connected with the threshold circuit and the logic forward channel circuit. According to the invention, the performance of an analyzer is improved.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language chi ; eng
recordid cdi_epo_espacenet_CN103713270A
source esp@cenet
subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Test device for logic analyzer forward channel
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-14T12%3A55%3A18IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=SONG%20YUNQU&rft.date=2014-04-09&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN103713270A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true