A CORROSION METHOD FOR TESTING THE STRESS-RESISTANCE OF CONNECTING LEGS OF SEMICONDUCTOR DEVICES

Bibliographische Detailangaben

Hauptverfasser:	LI HU, PENG JIANMING, SHEN ZHUOSHEN
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS SEMICONDUCTOR DEVICES TESTING
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