Avoidance of susceptibility artifacts in magnetic resonance measurements via targeted addition of recycled materials in plastic parts

Avoidance of susceptibility artifacts in magnetic resonance measurements via targeted addition of recycled materials in plastic parts

Susceptibility artifacts are significantly reduced or avoided in a magnetic resonance image by producing one or more components of a magnetic resonance system from plastic material having a targeted addition or recycled plastic material.

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: PREISSLER ADELBERT, PORZELT KLAUS, KOEPPL SEBASTIAN
Format: Patent
Sprache:chi ; eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator PREISSLER ADELBERT
PORZELT KLAUS
KOEPPL SEBASTIAN
description Susceptibility artifacts are significantly reduced or avoided in a magnetic resonance image by producing one or more components of a magnetic resonance system from plastic material having a targeted addition or recycled plastic material.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN103197270A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN103197270A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN103197270A3</originalsourceid><addsrcrecordid>eNqNjT0KwkAQhdNYiHqH8QBCYopgGYJiZWUfxt1JGNg_dsdADuC93QQPYPXg473vbYtPO3nW6BSBHyC9k6Ig_GLDMgNG4QGVJGAHFkdHwgoiJe_WhSVM70iWXK5MjCAYRxLSgFqzsHeLNJKalcnQolBkNKsuGEyLLeSTtC82Q-Z0-OWuON6uz-5-ouB7SgEV5e--e1RlXV2ac1O29T-dL4R0TCo</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Avoidance of susceptibility artifacts in magnetic resonance measurements via targeted addition of recycled materials in plastic parts</title><source>esp@cenet</source><creator>PREISSLER ADELBERT ; PORZELT KLAUS ; KOEPPL SEBASTIAN</creator><creatorcontrib>PREISSLER ADELBERT ; PORZELT KLAUS ; KOEPPL SEBASTIAN</creatorcontrib><description>Susceptibility artifacts are significantly reduced or avoided in a magnetic resonance image by producing one or more components of a magnetic resonance system from plastic material having a targeted addition or recycled plastic material.</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2013</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20130710&amp;DB=EPODOC&amp;CC=CN&amp;NR=103197270A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20130710&amp;DB=EPODOC&amp;CC=CN&amp;NR=103197270A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>PREISSLER ADELBERT</creatorcontrib><creatorcontrib>PORZELT KLAUS</creatorcontrib><creatorcontrib>KOEPPL SEBASTIAN</creatorcontrib><title>Avoidance of susceptibility artifacts in magnetic resonance measurements via targeted addition of recycled materials in plastic parts</title><description>Susceptibility artifacts are significantly reduced or avoided in a magnetic resonance image by producing one or more components of a magnetic resonance system from plastic material having a targeted addition or recycled plastic material.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2013</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjT0KwkAQhdNYiHqH8QBCYopgGYJiZWUfxt1JGNg_dsdADuC93QQPYPXg473vbYtPO3nW6BSBHyC9k6Ig_GLDMgNG4QGVJGAHFkdHwgoiJe_WhSVM70iWXK5MjCAYRxLSgFqzsHeLNJKalcnQolBkNKsuGEyLLeSTtC82Q-Z0-OWuON6uz-5-ouB7SgEV5e--e1RlXV2ac1O29T-dL4R0TCo</recordid><startdate>20130710</startdate><enddate>20130710</enddate><creator>PREISSLER ADELBERT</creator><creator>PORZELT KLAUS</creator><creator>KOEPPL SEBASTIAN</creator><scope>EVB</scope></search><sort><creationdate>20130710</creationdate><title>Avoidance of susceptibility artifacts in magnetic resonance measurements via targeted addition of recycled materials in plastic parts</title><author>PREISSLER ADELBERT ; PORZELT KLAUS ; KOEPPL SEBASTIAN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN103197270A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2013</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>PREISSLER ADELBERT</creatorcontrib><creatorcontrib>PORZELT KLAUS</creatorcontrib><creatorcontrib>KOEPPL SEBASTIAN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>PREISSLER ADELBERT</au><au>PORZELT KLAUS</au><au>KOEPPL SEBASTIAN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Avoidance of susceptibility artifacts in magnetic resonance measurements via targeted addition of recycled materials in plastic parts</title><date>2013-07-10</date><risdate>2013</risdate><abstract>Susceptibility artifacts are significantly reduced or avoided in a magnetic resonance image by producing one or more components of a magnetic resonance system from plastic material having a targeted addition or recycled plastic material.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language chi ; eng
recordid cdi_epo_espacenet_CN103197270A
source esp@cenet
subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Avoidance of susceptibility artifacts in magnetic resonance measurements via targeted addition of recycled materials in plastic parts
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-18T03%3A01%3A50IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=PREISSLER%20ADELBERT&rft.date=2013-07-10&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN103197270A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true