Semiconductor testing method

Semiconductor testing method

The invention discloses a semiconductor testing method which comprises the following steps of: setting a first reference and a second reference, comparing electrical parameters of a unit to be tested under a certain set value with a relationship of the first reference and the second reference by ado...

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Hauptverfasser: QIAN LIANG, SUO XIN, ZHANG RUOCHENG
Format: Patent
Sprache:chi ; eng
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INFORMATION STORAGE
PHYSICS
STATIC STORES
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creator QIAN LIANG
SUO XIN
ZHANG RUOCHENG
description The invention discloses a semiconductor testing method which comprises the following steps of: setting a first reference and a second reference, comparing electrical parameters of a unit to be tested under a certain set value with a relationship of the first reference and the second reference by adopting a testing machine, judging whether the parameters are qualified, wherein if the consumed time compared in every time is within a nanosecond level, the testing time for one time is greatly shortened, the condition that 16-time tests is required in every time is avoided, programming language is not required to be used for selecting, the total testing time is further shortened, and simultaneously the testing operation is relatively easy and fast.
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STATIC STORES
title Semiconductor testing method
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