Variable-frequency series resonance test method based on FPGA (field programmable gate array)
The invention provides a variable-frequency series resonance test method based on an FPGA (field programmable gate array). The method comprises the following steps: collecting voltage signals and current signals of a three-phase power supply; conditioning the voltage signals and the current signals...
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creator | LIU MIN XIE BINGPING XIE DEYING FU ZHIHONG ZHU YIGANG LIN ZHIMING LI GUOLIANG DONG YUXI LI CHUNYAN XIAO YUN HUANG SUIWEN WANG JUNXING WANG YUNLONG ZENG LI CHEN FEN WANG WANBAO |
description | The invention provides a variable-frequency series resonance test method based on an FPGA (field programmable gate array). The method comprises the following steps: collecting voltage signals and current signals of a three-phase power supply; conditioning the voltage signals and the current signals with a VHS-ADC (video home system-analog to digital converter) platform; carrying out the SVPWM (space vector pulse width modulation) according to the digital voltage signals and the digital current signals obtained through the conditioning and sine wave and cosine wave so as to obtain the SVPWM modulation signal; establishing a VHS-ADC control system based on an FPGA chip for realizing the SVPWM manner; generating SVPWM pulse signals from the SVPWM modulation signals with the VHS-ADC control system; and carrying out the series resonance test according to the SVPWM pulse signals. According to the technology disclosed by the invention, the power factor of a power supply on the alternating-current (AC) input side of |
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The method comprises the following steps: collecting voltage signals and current signals of a three-phase power supply; conditioning the voltage signals and the current signals with a VHS-ADC (video home system-analog to digital converter) platform; carrying out the SVPWM (space vector pulse width modulation) according to the digital voltage signals and the digital current signals obtained through the conditioning and sine wave and cosine wave so as to obtain the SVPWM modulation signal; establishing a VHS-ADC control system based on an FPGA chip for realizing the SVPWM manner; generating SVPWM pulse signals from the SVPWM modulation signals with the VHS-ADC control system; and carrying out the series resonance test according to the SVPWM pulse signals. According to the technology disclosed by the invention, the power factor of a power supply on the alternating-current (AC) input side of</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2012</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20121024&DB=EPODOC&CC=CN&NR=102749566A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20121024&DB=EPODOC&CC=CN&NR=102749566A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LIU MIN</creatorcontrib><creatorcontrib>XIE BINGPING</creatorcontrib><creatorcontrib>XIE DEYING</creatorcontrib><creatorcontrib>FU ZHIHONG</creatorcontrib><creatorcontrib>ZHU YIGANG</creatorcontrib><creatorcontrib>LIN ZHIMING</creatorcontrib><creatorcontrib>LI GUOLIANG</creatorcontrib><creatorcontrib>DONG YUXI</creatorcontrib><creatorcontrib>LI CHUNYAN</creatorcontrib><creatorcontrib>XIAO YUN</creatorcontrib><creatorcontrib>HUANG SUIWEN</creatorcontrib><creatorcontrib>WANG JUNXING</creatorcontrib><creatorcontrib>WANG YUNLONG</creatorcontrib><creatorcontrib>ZENG LI</creatorcontrib><creatorcontrib>CHEN FEN</creatorcontrib><creatorcontrib>WANG WANBAO</creatorcontrib><title>Variable-frequency series resonance test method based on FPGA (field programmable gate array)</title><description>The invention provides a variable-frequency series resonance test method based on an FPGA (field programmable gate array). The method comprises the following steps: collecting voltage signals and current signals of a three-phase power supply; conditioning the voltage signals and the current signals with a VHS-ADC (video home system-analog to digital converter) platform; carrying out the SVPWM (space vector pulse width modulation) according to the digital voltage signals and the digital current signals obtained through the conditioning and sine wave and cosine wave so as to obtain the SVPWM modulation signal; establishing a VHS-ADC control system based on an FPGA chip for realizing the SVPWM manner; generating SVPWM pulse signals from the SVPWM modulation signals with the VHS-ADC control system; and carrying out the series resonance test according to the SVPWM pulse signals. According to the technology disclosed by the invention, the power factor of a power supply on the alternating-current (AC) input side of</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2012</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNzLsOgkAQRmEaC6O-w9hpQeIFMZaEiFbGwtgZMsAPkrC7OLMWvL0x8QGsTvPljIPHnaXlokNYC15v2HIghbRQEqizbEuQh3oy8E9XUcGKipyl7HpKaFG36CrqxTXCxnxH1LAHsQgPy2kwqrlTzH6dBPPseEvPIXqXQ3suYeHz9LJebfbRYRfHyfYf8wGnxTtr</recordid><startdate>20121024</startdate><enddate>20121024</enddate><creator>LIU MIN</creator><creator>XIE BINGPING</creator><creator>XIE DEYING</creator><creator>FU ZHIHONG</creator><creator>ZHU YIGANG</creator><creator>LIN ZHIMING</creator><creator>LI GUOLIANG</creator><creator>DONG YUXI</creator><creator>LI CHUNYAN</creator><creator>XIAO YUN</creator><creator>HUANG SUIWEN</creator><creator>WANG JUNXING</creator><creator>WANG YUNLONG</creator><creator>ZENG LI</creator><creator>CHEN FEN</creator><creator>WANG WANBAO</creator><scope>EVB</scope></search><sort><creationdate>20121024</creationdate><title>Variable-frequency series resonance test method based on FPGA (field programmable gate array)</title><author>LIU MIN ; XIE BINGPING ; XIE DEYING ; FU ZHIHONG ; ZHU YIGANG ; LIN ZHIMING ; LI GUOLIANG ; DONG YUXI ; LI CHUNYAN ; XIAO YUN ; HUANG SUIWEN ; WANG JUNXING ; WANG YUNLONG ; ZENG LI ; CHEN FEN ; WANG WANBAO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN102749566A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2012</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>LIU MIN</creatorcontrib><creatorcontrib>XIE BINGPING</creatorcontrib><creatorcontrib>XIE DEYING</creatorcontrib><creatorcontrib>FU ZHIHONG</creatorcontrib><creatorcontrib>ZHU YIGANG</creatorcontrib><creatorcontrib>LIN ZHIMING</creatorcontrib><creatorcontrib>LI GUOLIANG</creatorcontrib><creatorcontrib>DONG YUXI</creatorcontrib><creatorcontrib>LI CHUNYAN</creatorcontrib><creatorcontrib>XIAO YUN</creatorcontrib><creatorcontrib>HUANG SUIWEN</creatorcontrib><creatorcontrib>WANG JUNXING</creatorcontrib><creatorcontrib>WANG YUNLONG</creatorcontrib><creatorcontrib>ZENG LI</creatorcontrib><creatorcontrib>CHEN FEN</creatorcontrib><creatorcontrib>WANG WANBAO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LIU MIN</au><au>XIE BINGPING</au><au>XIE DEYING</au><au>FU ZHIHONG</au><au>ZHU YIGANG</au><au>LIN ZHIMING</au><au>LI GUOLIANG</au><au>DONG YUXI</au><au>LI CHUNYAN</au><au>XIAO YUN</au><au>HUANG SUIWEN</au><au>WANG JUNXING</au><au>WANG YUNLONG</au><au>ZENG LI</au><au>CHEN FEN</au><au>WANG WANBAO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Variable-frequency series resonance test method based on FPGA (field programmable gate array)</title><date>2012-10-24</date><risdate>2012</risdate><abstract>The invention provides a variable-frequency series resonance test method based on an FPGA (field programmable gate array). The method comprises the following steps: collecting voltage signals and current signals of a three-phase power supply; conditioning the voltage signals and the current signals with a VHS-ADC (video home system-analog to digital converter) platform; carrying out the SVPWM (space vector pulse width modulation) according to the digital voltage signals and the digital current signals obtained through the conditioning and sine wave and cosine wave so as to obtain the SVPWM modulation signal; establishing a VHS-ADC control system based on an FPGA chip for realizing the SVPWM manner; generating SVPWM pulse signals from the SVPWM modulation signals with the VHS-ADC control system; and carrying out the series resonance test according to the SVPWM pulse signals. According to the technology disclosed by the invention, the power factor of a power supply on the alternating-current (AC) input side of</abstract><oa>free_for_read</oa></addata></record> |
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subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
title | Variable-frequency series resonance test method based on FPGA (field programmable gate array) |
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