Method for visually selecting device under test in circuit test

Method for visually selecting device under test in circuit test

The invention discloses a method for visually selecting a device under test in a circuit board test, which is characterized by including: calculating to obtain the top left corner coordinate and the bottom right corner coordinate of the device under test in a circuit board coordinate system accordin...

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Hauptverfasser: SHEN GUANTING, LIU XIAOPING, LI HENG, LU QIANG, ZHANG JING
Format: Patent
Sprache:chi ; eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator SHEN GUANTING
LIU XIAOPING
LI HENG
LU QIANG
ZHANG JING
description The invention discloses a method for visually selecting a device under test in a circuit board test, which is characterized by including: calculating to obtain the top left corner coordinate and the bottom right corner coordinate of the device under test in a circuit board coordinate system according to the tag number of the device under test by looking up template files, a material list and a component base; converting to obtain the top left corner coordinate and the bottom right corner coordinate of the device under test in an electronic picture coordinate system according to size proportional relation of a circuit board and an electronic picture; calculating top left corner coordinates and bottom right corner coordinates of all devices on the circuit board in the electronic picture coordinate system one by one to generate a device position information table; and looking up the device position information table according to clicking positions of the users on the electronic picture to obtain the tag number a
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Method for visually selecting device under test in circuit test
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