Temperature controller test device and method for calibration test and aging test of temperature controller
Gespeichert in:
Hauptverfasser: | , , , , , , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | CHENG ZAIXUE LAI SHUNQIAO WENG JIZHAO LIANG XUMING DENG XIANGMING LUO YUQIANG WANG FANG |
description | |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN102520712BB</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN102520712BB</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN102520712BB3</originalsourceid><addsrcrecordid>eNqNjLEKwjAYhLM4iPoOP-5CGxH3FsXJqXuJyaUG0_whiT6_lTo6OH0c990txaPDGJFUeSaQ5lASe49EBbmQwctpkAqGRpQ7G7KcSCvvbtPCcZi1T68GF4Y5sp3463QtFlb5jM2XK7E9n7r2skPkHjkqjYDSt9e6kgdZHWvZNPu_pDe6q0KH</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Temperature controller test device and method for calibration test and aging test of temperature controller</title><source>esp@cenet</source><creator>CHENG ZAIXUE ; LAI SHUNQIAO ; WENG JIZHAO ; LIANG XUMING ; DENG XIANGMING ; LUO YUQIANG ; WANG FANG</creator><creatorcontrib>CHENG ZAIXUE ; LAI SHUNQIAO ; WENG JIZHAO ; LIANG XUMING ; DENG XIANGMING ; LUO YUQIANG ; WANG FANG</creatorcontrib><language>chi ; eng</language><subject>CONTROL OR REGULATING SYSTEMS IN GENERAL ; CONTROLLING ; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS ; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS ; PHYSICS ; REGULATING</subject><creationdate>2014</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20140416&DB=EPODOC&CC=CN&NR=102520712B$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20140416&DB=EPODOC&CC=CN&NR=102520712B$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CHENG ZAIXUE</creatorcontrib><creatorcontrib>LAI SHUNQIAO</creatorcontrib><creatorcontrib>WENG JIZHAO</creatorcontrib><creatorcontrib>LIANG XUMING</creatorcontrib><creatorcontrib>DENG XIANGMING</creatorcontrib><creatorcontrib>LUO YUQIANG</creatorcontrib><creatorcontrib>WANG FANG</creatorcontrib><title>Temperature controller test device and method for calibration test and aging test of temperature controller</title><subject>CONTROL OR REGULATING SYSTEMS IN GENERAL</subject><subject>CONTROLLING</subject><subject>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</subject><subject>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</subject><subject>PHYSICS</subject><subject>REGULATING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2014</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjLEKwjAYhLM4iPoOP-5CGxH3FsXJqXuJyaUG0_whiT6_lTo6OH0c990txaPDGJFUeSaQ5lASe49EBbmQwctpkAqGRpQ7G7KcSCvvbtPCcZi1T68GF4Y5sp3463QtFlb5jM2XK7E9n7r2skPkHjkqjYDSt9e6kgdZHWvZNPu_pDe6q0KH</recordid><startdate>20140416</startdate><enddate>20140416</enddate><creator>CHENG ZAIXUE</creator><creator>LAI SHUNQIAO</creator><creator>WENG JIZHAO</creator><creator>LIANG XUMING</creator><creator>DENG XIANGMING</creator><creator>LUO YUQIANG</creator><creator>WANG FANG</creator><scope>EVB</scope></search><sort><creationdate>20140416</creationdate><title>Temperature controller test device and method for calibration test and aging test of temperature controller</title><author>CHENG ZAIXUE ; LAI SHUNQIAO ; WENG JIZHAO ; LIANG XUMING ; DENG XIANGMING ; LUO YUQIANG ; WANG FANG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN102520712BB3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2014</creationdate><topic>CONTROL OR REGULATING SYSTEMS IN GENERAL</topic><topic>CONTROLLING</topic><topic>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</topic><topic>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</topic><topic>PHYSICS</topic><topic>REGULATING</topic><toplevel>online_resources</toplevel><creatorcontrib>CHENG ZAIXUE</creatorcontrib><creatorcontrib>LAI SHUNQIAO</creatorcontrib><creatorcontrib>WENG JIZHAO</creatorcontrib><creatorcontrib>LIANG XUMING</creatorcontrib><creatorcontrib>DENG XIANGMING</creatorcontrib><creatorcontrib>LUO YUQIANG</creatorcontrib><creatorcontrib>WANG FANG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CHENG ZAIXUE</au><au>LAI SHUNQIAO</au><au>WENG JIZHAO</au><au>LIANG XUMING</au><au>DENG XIANGMING</au><au>LUO YUQIANG</au><au>WANG FANG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Temperature controller test device and method for calibration test and aging test of temperature controller</title><date>2014-04-16</date><risdate>2014</risdate><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | chi ; eng |
recordid | cdi_epo_espacenet_CN102520712BB |
source | esp@cenet |
subjects | CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING |
title | Temperature controller test device and method for calibration test and aging test of temperature controller |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-19T07%3A52%3A01IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=CHENG%20ZAIXUE&rft.date=2014-04-16&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN102520712BB%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |