Assessment method of electronic complete machine acceleration service life
An assessment method of electronic complete machine acceleration service life includes four steps: step1, determining prior failure rate of products according to various standards, actual experiment information and expert information; step2, determining parameter value in an order Dirichlet model ac...
Gespeichert in:
| Hauptverfasser: | , , , , , |
|---|---|
| Format: | Patent |
| Sprache: | chi ; eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | ZHAO SHUAISHUAI YAO JUN ZHOU XIUFENG DENG QING ZHANG JUN XU MINGGE |
| description | An assessment method of electronic complete machine acceleration service life includes four steps: step1, determining prior failure rate of products according to various standards, actual experiment information and expert information; step2, determining parameter value in an order Dirichlet model according to obtained prior failure rate; step3, conducting acceleration service life experiments on the products and determining likelihood function capable of well indicating experiment information according to experiment modes and results; step4, calculating posterior distribution from the prior information and the likelihood function to obtain posterior reliability and failure rate and accordingly obtain service life characteristics of an electronic complete machine. The assessment method is scientific in conception, resolves the actual problems of lack of acceleration model and less complete machine samples, is a system grade acceleration assessment method and provides reliable evidence for improvement of produc |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN102508957A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN102508957A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN102508957A3</originalsourceid><addsrcrecordid>eNqNyjEKAjEQRuE0FqLeYTyAsCqLa7ksilhY2S9h_JcNJJmQGTy_Fh7A6hXfW7p7rwrVhGyUYLO8SCZCBFuVHJhYUokwUPI8hwzyzF-u3oJkUtR3YFAME9ZuMfmo2Py6ctvr5TncdigyQotnZNg4PPbNoW26c3vqj_88H1wiNYg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Assessment method of electronic complete machine acceleration service life</title><source>esp@cenet</source><creator>ZHAO SHUAISHUAI ; YAO JUN ; ZHOU XIUFENG ; DENG QING ; ZHANG JUN ; XU MINGGE</creator><creatorcontrib>ZHAO SHUAISHUAI ; YAO JUN ; ZHOU XIUFENG ; DENG QING ; ZHANG JUN ; XU MINGGE</creatorcontrib><description>An assessment method of electronic complete machine acceleration service life includes four steps: step1, determining prior failure rate of products according to various standards, actual experiment information and expert information; step2, determining parameter value in an order Dirichlet model according to obtained prior failure rate; step3, conducting acceleration service life experiments on the products and determining likelihood function capable of well indicating experiment information according to experiment modes and results; step4, calculating posterior distribution from the prior information and the likelihood function to obtain posterior reliability and failure rate and accordingly obtain service life characteristics of an electronic complete machine. The assessment method is scientific in conception, resolves the actual problems of lack of acceleration model and less complete machine samples, is a system grade acceleration assessment method and provides reliable evidence for improvement of produc</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS</subject><creationdate>2012</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20120620&DB=EPODOC&CC=CN&NR=102508957A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20120620&DB=EPODOC&CC=CN&NR=102508957A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ZHAO SHUAISHUAI</creatorcontrib><creatorcontrib>YAO JUN</creatorcontrib><creatorcontrib>ZHOU XIUFENG</creatorcontrib><creatorcontrib>DENG QING</creatorcontrib><creatorcontrib>ZHANG JUN</creatorcontrib><creatorcontrib>XU MINGGE</creatorcontrib><title>Assessment method of electronic complete machine acceleration service life</title><description>An assessment method of electronic complete machine acceleration service life includes four steps: step1, determining prior failure rate of products according to various standards, actual experiment information and expert information; step2, determining parameter value in an order Dirichlet model according to obtained prior failure rate; step3, conducting acceleration service life experiments on the products and determining likelihood function capable of well indicating experiment information according to experiment modes and results; step4, calculating posterior distribution from the prior information and the likelihood function to obtain posterior reliability and failure rate and accordingly obtain service life characteristics of an electronic complete machine. The assessment method is scientific in conception, resolves the actual problems of lack of acceleration model and less complete machine samples, is a system grade acceleration assessment method and provides reliable evidence for improvement of produc</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2012</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyjEKAjEQRuE0FqLeYTyAsCqLa7ksilhY2S9h_JcNJJmQGTy_Fh7A6hXfW7p7rwrVhGyUYLO8SCZCBFuVHJhYUokwUPI8hwzyzF-u3oJkUtR3YFAME9ZuMfmo2Py6ctvr5TncdigyQotnZNg4PPbNoW26c3vqj_88H1wiNYg</recordid><startdate>20120620</startdate><enddate>20120620</enddate><creator>ZHAO SHUAISHUAI</creator><creator>YAO JUN</creator><creator>ZHOU XIUFENG</creator><creator>DENG QING</creator><creator>ZHANG JUN</creator><creator>XU MINGGE</creator><scope>EVB</scope></search><sort><creationdate>20120620</creationdate><title>Assessment method of electronic complete machine acceleration service life</title><author>ZHAO SHUAISHUAI ; YAO JUN ; ZHOU XIUFENG ; DENG QING ; ZHANG JUN ; XU MINGGE</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN102508957A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2012</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>ZHAO SHUAISHUAI</creatorcontrib><creatorcontrib>YAO JUN</creatorcontrib><creatorcontrib>ZHOU XIUFENG</creatorcontrib><creatorcontrib>DENG QING</creatorcontrib><creatorcontrib>ZHANG JUN</creatorcontrib><creatorcontrib>XU MINGGE</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ZHAO SHUAISHUAI</au><au>YAO JUN</au><au>ZHOU XIUFENG</au><au>DENG QING</au><au>ZHANG JUN</au><au>XU MINGGE</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Assessment method of electronic complete machine acceleration service life</title><date>2012-06-20</date><risdate>2012</risdate><abstract>An assessment method of electronic complete machine acceleration service life includes four steps: step1, determining prior failure rate of products according to various standards, actual experiment information and expert information; step2, determining parameter value in an order Dirichlet model according to obtained prior failure rate; step3, conducting acceleration service life experiments on the products and determining likelihood function capable of well indicating experiment information according to experiment modes and results; step4, calculating posterior distribution from the prior information and the likelihood function to obtain posterior reliability and failure rate and accordingly obtain service life characteristics of an electronic complete machine. The assessment method is scientific in conception, resolves the actual problems of lack of acceleration model and less complete machine samples, is a system grade acceleration assessment method and provides reliable evidence for improvement of produc</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | chi ; eng |
| recordid | cdi_epo_espacenet_CN102508957A |
| source | esp@cenet |
| subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS |
| title | Assessment method of electronic complete machine acceleration service life |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-04T15%3A58%3A03IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=ZHAO%20SHUAISHUAI&rft.date=2012-06-20&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN102508957A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |