Device and method for detecting concentration of gas to be detected through temperature correction

Device and method for detecting concentration of gas to be detected through temperature correction

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: CAO HUIQIN, XIANG ENYAN, JIANG PEIGANG, ZHAO SHULI
Format: Patent
Sprache:chi ; eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator CAO HUIQIN
XIANG ENYAN
JIANG PEIGANG
ZHAO SHULI
description
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN102507507BB</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN102507507BB</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN102507507BB3</originalsourceid><addsrcrecordid>eNqNjLEKwjAURbs4iPoPD3ehKuLeqjg5uZc0uU0CbV55ffX7jdAPEC7c5ZyzLtobPtGCTHI0QAM76ljIQWE1Jk-Wk0VSMRo5EXfkzUTK1GKB4EiD8OwDKYYRmZwF2RP5JThti1Vn-gm75TfF_nF_188DRm4wjSb3oU39OpanS3nNq6rzX9AXymA-ww</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Device and method for detecting concentration of gas to be detected through temperature correction</title><source>esp@cenet</source><creator>CAO HUIQIN ; XIANG ENYAN ; JIANG PEIGANG ; ZHAO SHULI</creator><creatorcontrib>CAO HUIQIN ; XIANG ENYAN ; JIANG PEIGANG ; ZHAO SHULI</creatorcontrib><language>chi ; eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2013</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20130904&amp;DB=EPODOC&amp;CC=CN&amp;NR=102507507B$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20130904&amp;DB=EPODOC&amp;CC=CN&amp;NR=102507507B$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CAO HUIQIN</creatorcontrib><creatorcontrib>XIANG ENYAN</creatorcontrib><creatorcontrib>JIANG PEIGANG</creatorcontrib><creatorcontrib>ZHAO SHULI</creatorcontrib><title>Device and method for detecting concentration of gas to be detected through temperature correction</title><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2013</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjLEKwjAURbs4iPoPD3ehKuLeqjg5uZc0uU0CbV55ffX7jdAPEC7c5ZyzLtobPtGCTHI0QAM76ljIQWE1Jk-Wk0VSMRo5EXfkzUTK1GKB4EiD8OwDKYYRmZwF2RP5JThti1Vn-gm75TfF_nF_188DRm4wjSb3oU39OpanS3nNq6rzX9AXymA-ww</recordid><startdate>20130904</startdate><enddate>20130904</enddate><creator>CAO HUIQIN</creator><creator>XIANG ENYAN</creator><creator>JIANG PEIGANG</creator><creator>ZHAO SHULI</creator><scope>EVB</scope></search><sort><creationdate>20130904</creationdate><title>Device and method for detecting concentration of gas to be detected through temperature correction</title><author>CAO HUIQIN ; XIANG ENYAN ; JIANG PEIGANG ; ZHAO SHULI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN102507507BB3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2013</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>CAO HUIQIN</creatorcontrib><creatorcontrib>XIANG ENYAN</creatorcontrib><creatorcontrib>JIANG PEIGANG</creatorcontrib><creatorcontrib>ZHAO SHULI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CAO HUIQIN</au><au>XIANG ENYAN</au><au>JIANG PEIGANG</au><au>ZHAO SHULI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Device and method for detecting concentration of gas to be detected through temperature correction</title><date>2013-09-04</date><risdate>2013</risdate><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language chi ; eng
recordid cdi_epo_espacenet_CN102507507BB
source esp@cenet
subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Device and method for detecting concentration of gas to be detected through temperature correction
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-29T20%3A28%3A38IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=CAO%20HUIQIN&rft.date=2013-09-04&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN102507507BB%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true