Probe card

A probe card is provided to universally use a main circuit board regardless of the patterns of a probe module by dividing electric signals and transmitting the electric signals from a lower side circuit board to each probe module. A probe module unit(110) in electrical contact with a semiconductor c...

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Hauptverfasser:	YOO SEUNG HO, SHIM YUN HEE, CHUNG IN BUHM, YOON SUNG HEE, SONG BYUNG CHANG, KIM DONG IL
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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creator	YOO SEUNG HO SHIM YUN HEE CHUNG IN BUHM YOON SUNG HEE SONG BYUNG CHANG KIM DONG IL
description	A probe card is provided to universally use a main circuit board regardless of the patterns of a probe module by dividing electric signals and transmitting the electric signals from a lower side circuit board to each probe module. A probe module unit(110) in electrical contact with a semiconductor chip is arranged on a space transformer(120). An interconnector(150) is arranged between a main circuit board(160) and the space transformer. A reinforcing plate(170) is mounted at the rear side of the main circuit board in order to reinforce the main circuit board. A lower side circuit board(130) is arranged at the body(121) of the space transformer. A connector(140) fixes the lower side circuit board to the body of the space transformer.
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language	chi ; eng
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subjects	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
title	Probe card
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