3d channel architecture for semiconductor devices

Semiconductor devices and methods for making such devices that contain a 3D channel architecture are described. The 3D channel architecture is formed using a dual trench structure containing with a plurality of lower trenches extending in an x and y directional channels and separated by a mesa and a...

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Hauptverfasser: HO IHSIU, KINZER DAN, CHALLA ASHOK, JO SEOKJIN, KIM SUKU, SAPP STEVEN, CALAFUT DAN, LARSEN MARK
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creator HO IHSIU
KINZER DAN
CHALLA ASHOK
JO SEOKJIN
KIM SUKU
SAPP STEVEN
CALAFUT DAN
LARSEN MARK
description Semiconductor devices and methods for making such devices that contain a 3D channel architecture are described. The 3D channel architecture is formed using a dual trench structure containing with a plurality of lower trenches extending in an x and y directional channels and separated by a mesa and an upper trench extending in a y direction and located in an upper portion of the substrate proximate a source region. Thus, smaller pillar trenches are formed within the main line-shaped trench. Such an architecture generates additional channel regions which are aligned substantially perpendicular to the conventional line-shaped channels. The channel regions, both conventional and perpendicular, are electrically connected by their corner and top regions to produce higher current flow in all three dimensions.; With such a configuration, higher channel density, a stronger inversion layer, and a more uniform threshold distribution can be obtained for the semiconductor device. Other embodiments are described.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN102449770A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN102449770A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN102449770A3</originalsourceid><addsrcrecordid>eNrjZDA0TlFIzkjMy0vNUUgsSs7ILElNLiktSlVIyy9SKE7NzUzOz0spTS4B8lJSyzKTU4t5GFjTEnOKU3mhNDeDoptriLOHbmpBfnxqcUFicmpeakm8s5-hgZGJiaW5uYGjMTFqAJuTK9g</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>3d channel architecture for semiconductor devices</title><source>esp@cenet</source><creator>HO IHSIU ; KINZER DAN ; CHALLA ASHOK ; JO SEOKJIN ; KIM SUKU ; SAPP STEVEN ; CALAFUT DAN ; LARSEN MARK</creator><creatorcontrib>HO IHSIU ; KINZER DAN ; CHALLA ASHOK ; JO SEOKJIN ; KIM SUKU ; SAPP STEVEN ; CALAFUT DAN ; LARSEN MARK</creatorcontrib><description>Semiconductor devices and methods for making such devices that contain a 3D channel architecture are described. The 3D channel architecture is formed using a dual trench structure containing with a plurality of lower trenches extending in an x and y directional channels and separated by a mesa and an upper trench extending in a y direction and located in an upper portion of the substrate proximate a source region. Thus, smaller pillar trenches are formed within the main line-shaped trench. Such an architecture generates additional channel regions which are aligned substantially perpendicular to the conventional line-shaped channels. The channel regions, both conventional and perpendicular, are electrically connected by their corner and top regions to produce higher current flow in all three dimensions.; With such a configuration, higher channel density, a stronger inversion layer, and a more uniform threshold distribution can be obtained for the semiconductor device. Other embodiments are described.</description><language>chi ; eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2012</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20120509&amp;DB=EPODOC&amp;CC=CN&amp;NR=102449770A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20120509&amp;DB=EPODOC&amp;CC=CN&amp;NR=102449770A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HO IHSIU</creatorcontrib><creatorcontrib>KINZER DAN</creatorcontrib><creatorcontrib>CHALLA ASHOK</creatorcontrib><creatorcontrib>JO SEOKJIN</creatorcontrib><creatorcontrib>KIM SUKU</creatorcontrib><creatorcontrib>SAPP STEVEN</creatorcontrib><creatorcontrib>CALAFUT DAN</creatorcontrib><creatorcontrib>LARSEN MARK</creatorcontrib><title>3d channel architecture for semiconductor devices</title><description>Semiconductor devices and methods for making such devices that contain a 3D channel architecture are described. The 3D channel architecture is formed using a dual trench structure containing with a plurality of lower trenches extending in an x and y directional channels and separated by a mesa and an upper trench extending in a y direction and located in an upper portion of the substrate proximate a source region. Thus, smaller pillar trenches are formed within the main line-shaped trench. Such an architecture generates additional channel regions which are aligned substantially perpendicular to the conventional line-shaped channels. The channel regions, both conventional and perpendicular, are electrically connected by their corner and top regions to produce higher current flow in all three dimensions.; With such a configuration, higher channel density, a stronger inversion layer, and a more uniform threshold distribution can be obtained for the semiconductor device. Other embodiments are described.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2012</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDA0TlFIzkjMy0vNUUgsSs7ILElNLiktSlVIyy9SKE7NzUzOz0spTS4B8lJSyzKTU4t5GFjTEnOKU3mhNDeDoptriLOHbmpBfnxqcUFicmpeakm8s5-hgZGJiaW5uYGjMTFqAJuTK9g</recordid><startdate>20120509</startdate><enddate>20120509</enddate><creator>HO IHSIU</creator><creator>KINZER DAN</creator><creator>CHALLA ASHOK</creator><creator>JO SEOKJIN</creator><creator>KIM SUKU</creator><creator>SAPP STEVEN</creator><creator>CALAFUT DAN</creator><creator>LARSEN MARK</creator><scope>EVB</scope></search><sort><creationdate>20120509</creationdate><title>3d channel architecture for semiconductor devices</title><author>HO IHSIU ; KINZER DAN ; CHALLA ASHOK ; JO SEOKJIN ; KIM SUKU ; SAPP STEVEN ; CALAFUT DAN ; LARSEN MARK</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN102449770A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2012</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>HO IHSIU</creatorcontrib><creatorcontrib>KINZER DAN</creatorcontrib><creatorcontrib>CHALLA ASHOK</creatorcontrib><creatorcontrib>JO SEOKJIN</creatorcontrib><creatorcontrib>KIM SUKU</creatorcontrib><creatorcontrib>SAPP STEVEN</creatorcontrib><creatorcontrib>CALAFUT DAN</creatorcontrib><creatorcontrib>LARSEN MARK</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HO IHSIU</au><au>KINZER DAN</au><au>CHALLA ASHOK</au><au>JO SEOKJIN</au><au>KIM SUKU</au><au>SAPP STEVEN</au><au>CALAFUT DAN</au><au>LARSEN MARK</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>3d channel architecture for semiconductor devices</title><date>2012-05-09</date><risdate>2012</risdate><abstract>Semiconductor devices and methods for making such devices that contain a 3D channel architecture are described. The 3D channel architecture is formed using a dual trench structure containing with a plurality of lower trenches extending in an x and y directional channels and separated by a mesa and an upper trench extending in a y direction and located in an upper portion of the substrate proximate a source region. Thus, smaller pillar trenches are formed within the main line-shaped trench. Such an architecture generates additional channel regions which are aligned substantially perpendicular to the conventional line-shaped channels. The channel regions, both conventional and perpendicular, are electrically connected by their corner and top regions to produce higher current flow in all three dimensions.; With such a configuration, higher channel density, a stronger inversion layer, and a more uniform threshold distribution can be obtained for the semiconductor device. Other embodiments are described.</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
title 3d channel architecture for semiconductor devices
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-09T10%3A53%3A58IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=HO%20IHSIU&rft.date=2012-05-09&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN102449770A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true