Back plate test method, apparatus thereof and system thereof

Back plate test method, apparatus thereof and system thereof

The invention provides a back plate test method, an apparatus thereof and a system thereof. The method comprises the following steps: sending a first test signal to a first pin to be tested of a first quadrature connector in a back plate; receiving a second test signal returned by a second pin to be...

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1. Verfasser: HUANG JINSI
Format: Patent
Sprache:chi ; eng
Schlagworte:
ELECTRIC COMMUNICATION TECHNIQUE
ELECTRICITY
TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION
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creator HUANG JINSI
description The invention provides a back plate test method, an apparatus thereof and a system thereof. The method comprises the following steps: sending a first test signal to a first pin to be tested of a first quadrature connector in a back plate; receiving a second test signal returned by a second pin to be tested of the first quadrature connector, wherein the first pin to be tested is corresponding to a third pin to be tested on a second quadrature connector in the back plate, the second pin to be tested is corresponding to a fourth pin to be tested of the second quadrature connector, and the third pin to be tested is corresponding to the fourth pin to be tested; carrying out verification processing on the first test signal and the second test signal, and determining whether the first pin to be tested, the second pin to be tested, the third pin to be tested, and the fourth pin to be tested are normal or not according to a verification result. The invention also provides a back plate test apparatus and a back plate t
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subjects ELECTRIC COMMUNICATION TECHNIQUE
ELECTRICITY
TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION
title Back plate test method, apparatus thereof and system thereof
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