Calibration method and device of capacitance measurement circuit
The invention discloses a calibration method of a capacitance measurement circuit, which is suitable for calibrating the capacitance measurement circuit by utilizing a capacitance reactance method. The calibration method comprises the following steps of: A. recording AD (Analog to Digital) acquisiti...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a calibration method of a capacitance measurement circuit, which is suitable for calibrating the capacitance measurement circuit by utilizing a capacitance reactance method. The calibration method comprises the following steps of: A. recording AD (Analog to Digital) acquisition values corresponding to a plurality of known capacitors, respectively solving a difference valuebetween the AD acquisition value of each known capacitor and the AD acquisition value of a reference capacitor; B. constructing an input-output characteristic equation of the capacitance measurement circuit by each known capacitance value and the corresponding difference value; C. obtaining the AD acquisition values of a capacitor to be measured and the reference capacitor in an actual environment, and introducing the difference value of the AD acquisition values to the input-output characteristic equation to obtain the value of the capacitor to be measured. By utilizing the method disclosed by the invention, the rand |
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