Simulation high-voltage switch tester
The invention discloses a simulation high-voltage switch tester which comprises a measuring device, a sensor, an input device and an output device, wherein the information detected by the sensor is transmitted to the measuring device; the measuring device generates an analog signal, and the analog s...
Gespeichert in:
Hauptverfasser: | , , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | CHEN NAIJIANG LIU XIAOZHUANG LIU JIALIANG |
description | The invention discloses a simulation high-voltage switch tester which comprises a measuring device, a sensor, an input device and an output device, wherein the information detected by the sensor is transmitted to the measuring device; the measuring device generates an analog signal, and the analog signal is output from the output device; the input device can set testing state for the measuring device; the output device is an LED (light-emitting diode) display device; and the input device is a keyboard device. The simulation high-voltage switch tester has the following advantages: not only are the teaching effects of the high-voltage experiments effectively improved, but also the abnormal experiments which can not be realized under general conditions can be carried out through development of the simulation training device of high-voltage electrical experiments, thus reducing the investment of experiment expenses and being easy for comprehensive promotion; and development of the simulation training device of hi |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN102081872A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN102081872A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN102081872A3</originalsourceid><addsrcrecordid>eNrjZFANzswtzUksyczPU8jITM_QLcvPKUlMT1UoLs8sSc5QKEktLkkt4mFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8c5-hgZGBhaGFuZGjsbEqAEAYNQncw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Simulation high-voltage switch tester</title><source>esp@cenet</source><creator>CHEN NAIJIANG ; LIU XIAOZHUANG ; LIU JIALIANG</creator><creatorcontrib>CHEN NAIJIANG ; LIU XIAOZHUANG ; LIU JIALIANG</creatorcontrib><description>The invention discloses a simulation high-voltage switch tester which comprises a measuring device, a sensor, an input device and an output device, wherein the information detected by the sensor is transmitted to the measuring device; the measuring device generates an analog signal, and the analog signal is output from the output device; the input device can set testing state for the measuring device; the output device is an LED (light-emitting diode) display device; and the input device is a keyboard device. The simulation high-voltage switch tester has the following advantages: not only are the teaching effects of the high-voltage experiments effectively improved, but also the abnormal experiments which can not be realized under general conditions can be carried out through development of the simulation training device of high-voltage electrical experiments, thus reducing the investment of experiment expenses and being easy for comprehensive promotion; and development of the simulation training device of hi</description><language>chi ; eng</language><subject>ADVERTISING ; APPLIANCES FOR TEACHING, OR COMMUNICATING WITH, THE BLIND,DEAF OR MUTE ; CRYPTOGRAPHY ; DIAGRAMS ; DISPLAY ; EDUCATION ; EDUCATIONAL OR DEMONSTRATION APPLIANCES ; GLOBES ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; PLANETARIA ; SEALS ; TESTING</subject><creationdate>2011</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20110601&DB=EPODOC&CC=CN&NR=102081872A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20110601&DB=EPODOC&CC=CN&NR=102081872A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CHEN NAIJIANG</creatorcontrib><creatorcontrib>LIU XIAOZHUANG</creatorcontrib><creatorcontrib>LIU JIALIANG</creatorcontrib><title>Simulation high-voltage switch tester</title><description>The invention discloses a simulation high-voltage switch tester which comprises a measuring device, a sensor, an input device and an output device, wherein the information detected by the sensor is transmitted to the measuring device; the measuring device generates an analog signal, and the analog signal is output from the output device; the input device can set testing state for the measuring device; the output device is an LED (light-emitting diode) display device; and the input device is a keyboard device. The simulation high-voltage switch tester has the following advantages: not only are the teaching effects of the high-voltage experiments effectively improved, but also the abnormal experiments which can not be realized under general conditions can be carried out through development of the simulation training device of high-voltage electrical experiments, thus reducing the investment of experiment expenses and being easy for comprehensive promotion; and development of the simulation training device of hi</description><subject>ADVERTISING</subject><subject>APPLIANCES FOR TEACHING, OR COMMUNICATING WITH, THE BLIND,DEAF OR MUTE</subject><subject>CRYPTOGRAPHY</subject><subject>DIAGRAMS</subject><subject>DISPLAY</subject><subject>EDUCATION</subject><subject>EDUCATIONAL OR DEMONSTRATION APPLIANCES</subject><subject>GLOBES</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>PLANETARIA</subject><subject>SEALS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2011</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFANzswtzUksyczPU8jITM_QLcvPKUlMT1UoLs8sSc5QKEktLkkt4mFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8c5-hgZGBhaGFuZGjsbEqAEAYNQncw</recordid><startdate>20110601</startdate><enddate>20110601</enddate><creator>CHEN NAIJIANG</creator><creator>LIU XIAOZHUANG</creator><creator>LIU JIALIANG</creator><scope>EVB</scope></search><sort><creationdate>20110601</creationdate><title>Simulation high-voltage switch tester</title><author>CHEN NAIJIANG ; LIU XIAOZHUANG ; LIU JIALIANG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN102081872A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2011</creationdate><topic>ADVERTISING</topic><topic>APPLIANCES FOR TEACHING, OR COMMUNICATING WITH, THE BLIND,DEAF OR MUTE</topic><topic>CRYPTOGRAPHY</topic><topic>DIAGRAMS</topic><topic>DISPLAY</topic><topic>EDUCATION</topic><topic>EDUCATIONAL OR DEMONSTRATION APPLIANCES</topic><topic>GLOBES</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>PLANETARIA</topic><topic>SEALS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>CHEN NAIJIANG</creatorcontrib><creatorcontrib>LIU XIAOZHUANG</creatorcontrib><creatorcontrib>LIU JIALIANG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CHEN NAIJIANG</au><au>LIU XIAOZHUANG</au><au>LIU JIALIANG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Simulation high-voltage switch tester</title><date>2011-06-01</date><risdate>2011</risdate><abstract>The invention discloses a simulation high-voltage switch tester which comprises a measuring device, a sensor, an input device and an output device, wherein the information detected by the sensor is transmitted to the measuring device; the measuring device generates an analog signal, and the analog signal is output from the output device; the input device can set testing state for the measuring device; the output device is an LED (light-emitting diode) display device; and the input device is a keyboard device. The simulation high-voltage switch tester has the following advantages: not only are the teaching effects of the high-voltage experiments effectively improved, but also the abnormal experiments which can not be realized under general conditions can be carried out through development of the simulation training device of high-voltage electrical experiments, thus reducing the investment of experiment expenses and being easy for comprehensive promotion; and development of the simulation training device of hi</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | chi ; eng |
recordid | cdi_epo_espacenet_CN102081872A |
source | esp@cenet |
subjects | ADVERTISING APPLIANCES FOR TEACHING, OR COMMUNICATING WITH, THE BLIND,DEAF OR MUTE CRYPTOGRAPHY DIAGRAMS DISPLAY EDUCATION EDUCATIONAL OR DEMONSTRATION APPLIANCES GLOBES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS PLANETARIA SEALS TESTING |
title | Simulation high-voltage switch tester |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-30T14%3A50%3A28IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=CHEN%20NAIJIANG&rft.date=2011-06-01&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN102081872A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |