PCIe test bench

The invention provides a peripheral component interface express (PCIe) test bench. The bench comprises a first host, a second host and a test board, wherein the test board comprises a PICe socket on the test board, a PICe switching unit connected with the PCIe socket, and a PCIe slot and a PCIe conn...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	ZHONG WEIJIE, HUANG YONGQIN, ZHU YABIN, CHEN HUI, LIU HONGYUN, LI ZHAN, YU ZUNHE
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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