PCIe test bench

The invention provides a peripheral component interface express (PCIe) test bench. The bench comprises a first host, a second host and a test board, wherein the test board comprises a PICe socket on the test board, a PICe switching unit connected with the PCIe socket, and a PCIe slot and a PCIe conn...

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Hauptverfasser:	ZHONG WEIJIE, HUANG YONGQIN, ZHU YABIN, CHEN HUI, LIU HONGYUN, LI ZHAN, YU ZUNHE
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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creator	ZHONG WEIJIE HUANG YONGQIN ZHU YABIN CHEN HUI LIU HONGYUN LI ZHAN YU ZUNHE
description	The invention provides a peripheral component interface express (PCIe) test bench. The bench comprises a first host, a second host and a test board, wherein the test board comprises a PICe socket on the test board, a PICe switching unit connected with the PCIe socket, and a PCIe slot and a PCIe connector which are connected with the PCIe switching unit; and the PCIe socket on the test board is connected with the first host and the second host. The PCIe test bench can be connected with more pieces of equipment to be tested, so that the more pieces of equipment to be tested can be tested at the same time, the utilization ratio of the test bench is improved and a long-distance test can be realized.
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subjects	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
title	PCIe test bench
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