Hundred picosecond pulse width measuring instrument
The invention relates to a hundred picosecond pulse width measuring instrument which comprises a spectroscope, a first light guide reflector, a second light guide reflector, a non-linear frequency doubling crystal, an optical imaging system, a CCD (Charge Coupled Device) detector and a data acquisit...
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creator | ZHU JIANQIANG HUANG KUIXI LIU CHONG ZHU BAOQIANG YANG LIN OUYANG XIAOPING |
description | The invention relates to a hundred picosecond pulse width measuring instrument which comprises a spectroscope, a first light guide reflector, a second light guide reflector, a non-linear frequency doubling crystal, an optical imaging system, a CCD (Charge Coupled Device) detector and a data acquisition and processing system, wherein the position relation of all components is shown as follow: an incident picosecond laser pulse to be measured divides a pulse to be measured into transmitted light and reflected light through the spectroscope; the transmitted light and the reflected light respectively pass through the first light guide reflector and the second light guide reflector and simultaneously enter into the non-linear frequency doubling crystal to generate a frequency doubling signal; and the frequency doubling signal is imaged on the CCD detector through the optical imaging system, and the data acquisition and processing system is used for finishing acquisition and data processing. The measuring instrumen |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN101871819A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN101871819A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN101871819A3</originalsourceid><addsrcrecordid>eNrjZDD2KM1LKUpNUSjITM4vTk3OzwMyS3OKUxXKM1NKMhRyUxOLS4sy89IVMvOKS4pKc1PzSngYWNMSgUp4oTQ3g6Kba4izh25qQX58anFBYnJqXmpJvLOfoYGhhbmhhaGlozExagBEDS0g</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Hundred picosecond pulse width measuring instrument</title><source>esp@cenet</source><creator>ZHU JIANQIANG ; HUANG KUIXI ; LIU CHONG ; ZHU BAOQIANG ; YANG LIN ; OUYANG XIAOPING</creator><creatorcontrib>ZHU JIANQIANG ; HUANG KUIXI ; LIU CHONG ; ZHU BAOQIANG ; YANG LIN ; OUYANG XIAOPING</creatorcontrib><description>The invention relates to a hundred picosecond pulse width measuring instrument which comprises a spectroscope, a first light guide reflector, a second light guide reflector, a non-linear frequency doubling crystal, an optical imaging system, a CCD (Charge Coupled Device) detector and a data acquisition and processing system, wherein the position relation of all components is shown as follow: an incident picosecond laser pulse to be measured divides a pulse to be measured into transmitted light and reflected light through the spectroscope; the transmitted light and the reflected light respectively pass through the first light guide reflector and the second light guide reflector and simultaneously enter into the non-linear frequency doubling crystal to generate a frequency doubling signal; and the frequency doubling signal is imaged on the CCD detector through the optical imaging system, and the data acquisition and processing system is used for finishing acquisition and data processing. The measuring instrumen</description><language>chi ; eng</language><subject>COLORIMETRY ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; PHYSICS ; RADIATION PYROMETRY ; TESTING</subject><creationdate>2010</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20101027&DB=EPODOC&CC=CN&NR=101871819A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,781,886,25569,76552</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20101027&DB=EPODOC&CC=CN&NR=101871819A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ZHU JIANQIANG</creatorcontrib><creatorcontrib>HUANG KUIXI</creatorcontrib><creatorcontrib>LIU CHONG</creatorcontrib><creatorcontrib>ZHU BAOQIANG</creatorcontrib><creatorcontrib>YANG LIN</creatorcontrib><creatorcontrib>OUYANG XIAOPING</creatorcontrib><title>Hundred picosecond pulse width measuring instrument</title><description>The invention relates to a hundred picosecond pulse width measuring instrument which comprises a spectroscope, a first light guide reflector, a second light guide reflector, a non-linear frequency doubling crystal, an optical imaging system, a CCD (Charge Coupled Device) detector and a data acquisition and processing system, wherein the position relation of all components is shown as follow: an incident picosecond laser pulse to be measured divides a pulse to be measured into transmitted light and reflected light through the spectroscope; the transmitted light and the reflected light respectively pass through the first light guide reflector and the second light guide reflector and simultaneously enter into the non-linear frequency doubling crystal to generate a frequency doubling signal; and the frequency doubling signal is imaged on the CCD detector through the optical imaging system, and the data acquisition and processing system is used for finishing acquisition and data processing. The measuring instrumen</description><subject>COLORIMETRY</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2010</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDD2KM1LKUpNUSjITM4vTk3OzwMyS3OKUxXKM1NKMhRyUxOLS4sy89IVMvOKS4pKc1PzSngYWNMSgUp4oTQ3g6Kba4izh25qQX58anFBYnJqXmpJvLOfoYGhhbmhhaGlozExagBEDS0g</recordid><startdate>20101027</startdate><enddate>20101027</enddate><creator>ZHU JIANQIANG</creator><creator>HUANG KUIXI</creator><creator>LIU CHONG</creator><creator>ZHU BAOQIANG</creator><creator>YANG LIN</creator><creator>OUYANG XIAOPING</creator><scope>EVB</scope></search><sort><creationdate>20101027</creationdate><title>Hundred picosecond pulse width measuring instrument</title><author>ZHU JIANQIANG ; HUANG KUIXI ; LIU CHONG ; ZHU BAOQIANG ; YANG LIN ; OUYANG XIAOPING</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN101871819A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2010</creationdate><topic>COLORIMETRY</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>ZHU JIANQIANG</creatorcontrib><creatorcontrib>HUANG KUIXI</creatorcontrib><creatorcontrib>LIU CHONG</creatorcontrib><creatorcontrib>ZHU BAOQIANG</creatorcontrib><creatorcontrib>YANG LIN</creatorcontrib><creatorcontrib>OUYANG XIAOPING</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ZHU JIANQIANG</au><au>HUANG KUIXI</au><au>LIU CHONG</au><au>ZHU BAOQIANG</au><au>YANG LIN</au><au>OUYANG XIAOPING</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Hundred picosecond pulse width measuring instrument</title><date>2010-10-27</date><risdate>2010</risdate><abstract>The invention relates to a hundred picosecond pulse width measuring instrument which comprises a spectroscope, a first light guide reflector, a second light guide reflector, a non-linear frequency doubling crystal, an optical imaging system, a CCD (Charge Coupled Device) detector and a data acquisition and processing system, wherein the position relation of all components is shown as follow: an incident picosecond laser pulse to be measured divides a pulse to be measured into transmitted light and reflected light through the spectroscope; the transmitted light and the reflected light respectively pass through the first light guide reflector and the second light guide reflector and simultaneously enter into the non-linear frequency doubling crystal to generate a frequency doubling signal; and the frequency doubling signal is imaged on the CCD detector through the optical imaging system, and the data acquisition and processing system is used for finishing acquisition and data processing. The measuring instrumen</abstract><oa>free_for_read</oa></addata></record> |
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subjects | COLORIMETRY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING |
title | Hundred picosecond pulse width measuring instrument |
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