Method for determining turn-to-turn short circuit, two-phase short circuit and single-phase short circuit of parallel reactors

The invention discloses a method for determining the turn-to-turn short circuit, two-phase short circuit and single-phase short circuit of parallel reactors, which comprises the following steps: (1) calculating a fault component delta*2 of a negative sequence voltage according to measurement; (2) ca...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	WANG WEI, YAO QINGLIN, LI RUISHENG, CAO LILU
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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