Focal spot size measurement with a movable edge located in a beam-shaping device
It is described a method for measuring the sharpness in an X-ray system (100). The measurement is based on a common edge response. An edge device (120) representing the projection device is placed within a beam-shaping device (470). Due to a high geometrical magnification factor the edge response fu...
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Format: | Patent |
Sprache: | chi ; eng |
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