Controlling embedded memory access
A microcontroller (30) includes a processor (32), an embedded memory (46) operatively coupled to the processor (32), and a microcontroller test interface (34) operatively connected to the processor (32) and the memory (36). The microcontroller (30) responds to a reset signal to perform a reset initi...
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creator | KHANH ATA GOODHUE GREG SHRIVASTAVA PANKAJ |
description | A microcontroller (30) includes a processor (32), an embedded memory (46) operatively coupled to the processor (32), and a microcontroller test interface (34) operatively connected to the processor (32) and the memory (36). The microcontroller (30) responds to a reset signal to perform a reset initiation that causes an initial disabled state of the test interface (34) to be set and execution of initiation code with the processor (32). This code execution optionally establishes a further disabled state. The microcontroller (30) provides an enabled state of the test interface for memory (46) access through the test interlace (34) during microcontroller (30) operation subsequent to the reset initiation unless the further disabled memory (46) access state is established by execution of the initiation code. |
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The microcontroller (30) responds to a reset signal to perform a reset initiation that causes an initial disabled state of the test interface (34) to be set and execution of initiation code with the processor (32). This code execution optionally establishes a further disabled state. The microcontroller (30) provides an enabled state of the test interface for memory (46) access through the test interlace (34) during microcontroller (30) operation subsequent to the reset initiation unless the further disabled memory (46) access state is established by execution of the initiation code.</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2008</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20080813&DB=EPODOC&CC=CN&NR=101243453A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20080813&DB=EPODOC&CC=CN&NR=101243453A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KHANH ATA</creatorcontrib><creatorcontrib>GOODHUE GREG</creatorcontrib><creatorcontrib>SHRIVASTAVA PANKAJ</creatorcontrib><title>Controlling embedded memory access</title><description>A microcontroller (30) includes a processor (32), an embedded memory (46) operatively coupled to the processor (32), and a microcontroller test interface (34) operatively connected to the processor (32) and the memory (36). The microcontroller (30) responds to a reset signal to perform a reset initiation that causes an initial disabled state of the test interface (34) to be set and execution of initiation code with the processor (32). This code execution optionally establishes a further disabled state. 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The microcontroller (30) responds to a reset signal to perform a reset initiation that causes an initial disabled state of the test interface (34) to be set and execution of initiation code with the processor (32). This code execution optionally establishes a further disabled state. The microcontroller (30) provides an enabled state of the test interface for memory (46) access through the test interlace (34) during microcontroller (30) operation subsequent to the reset initiation unless the further disabled memory (46) access state is established by execution of the initiation code.</abstract><oa>free_for_read</oa></addata></record> |
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language | chi ; eng |
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subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
title | Controlling embedded memory access |
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