Emulation and debug interfaces for testing an integrated circuit with an asynchronous microcontroller
A method of testing a data transmission and reception system comprises sending a test signal from a transmitter (14) of the system to a receiver (12) of the system, and analyzing the received signal. A duty cycle relationship is varied between the test signal and the timing signal used by the receiv...
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creator | JOORDENS GEERTJAN |
description | A method of testing a data transmission and reception system comprises sending a test signal from a transmitter (14) of the system to a receiver (12) of the system, and analyzing the received signal. A duty cycle relationship is varied between the test signal and the timing signal used by the receiver of the system, and the effect of the duty cycle variation is analyzed. Varying the duty cycle relationship provides duty cycle distortion (DCD), and this can be considered as a form of embedded jitter insertion. This type of jitter can be measured relatively easily. |
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A duty cycle relationship is varied between the test signal and the timing signal used by the receiver of the system, and the effect of the duty cycle variation is analyzed. Varying the duty cycle relationship provides duty cycle distortion (DCD), and this can be considered as a form of embedded jitter insertion. This type of jitter can be measured relatively easily.</description><language>chi ; eng</language><subject>ELECTRIC COMMUNICATION TECHNIQUE ; ELECTRICITY ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING ; TRANSMISSION ; TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION</subject><creationdate>2008</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20080716&DB=EPODOC&CC=CN&NR=101223726A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20080716&DB=EPODOC&CC=CN&NR=101223726A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>JOORDENS GEERTJAN</creatorcontrib><title>Emulation and debug interfaces for testing an integrated circuit with an asynchronous microcontroller</title><description>A method of testing a data transmission and reception system comprises sending a test signal from a transmitter (14) of the system to a receiver (12) of the system, and analyzing the received signal. A duty cycle relationship is varied between the test signal and the timing signal used by the receiver of the system, and the effect of the duty cycle variation is analyzed. Varying the duty cycle relationship provides duty cycle distortion (DCD), and this can be considered as a form of embedded jitter insertion. This type of jitter can be measured relatively easily.</description><subject>ELECTRIC COMMUNICATION TECHNIQUE</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><subject>TRANSMISSION</subject><subject>TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2008</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjTEKwkAQANNYiPqH9QGCSUDrECJWVvbhvGyShctu2NtD_L1RfIDVFDMw6wybKQVnJAyOO-jwkQYgNtTeeYzQi4JhNOJhCb5mUGfYgSf1iQyeZONHufhiP6qwpAgTeRUvbCohoG6zVe9CxN2Pm2x_ae719YCztBjnZcVobX3Lj3lRlOfiVJX_NG-C1kAL</recordid><startdate>20080716</startdate><enddate>20080716</enddate><creator>JOORDENS GEERTJAN</creator><scope>EVB</scope></search><sort><creationdate>20080716</creationdate><title>Emulation and debug interfaces for testing an integrated circuit with an asynchronous microcontroller</title><author>JOORDENS GEERTJAN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN101223726A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2008</creationdate><topic>ELECTRIC COMMUNICATION TECHNIQUE</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><topic>TRANSMISSION</topic><topic>TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION</topic><toplevel>online_resources</toplevel><creatorcontrib>JOORDENS GEERTJAN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>JOORDENS GEERTJAN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Emulation and debug interfaces for testing an integrated circuit with an asynchronous microcontroller</title><date>2008-07-16</date><risdate>2008</risdate><abstract>A method of testing a data transmission and reception system comprises sending a test signal from a transmitter (14) of the system to a receiver (12) of the system, and analyzing the received signal. A duty cycle relationship is varied between the test signal and the timing signal used by the receiver of the system, and the effect of the duty cycle variation is analyzed. Varying the duty cycle relationship provides duty cycle distortion (DCD), and this can be considered as a form of embedded jitter insertion. This type of jitter can be measured relatively easily.</abstract><oa>free_for_read</oa></addata></record> |
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language | chi ; eng |
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subjects | ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING TRANSMISSION TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION |
title | Emulation and debug interfaces for testing an integrated circuit with an asynchronous microcontroller |
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