System and method for sampling tests

System and method for sampling tests

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: XIE GUANGPING, XU XIXIANG, WANG WENHUI, WANG GUILIN, SUI DANNA, XU SIBIAO, ZHAO XIANZHONG, WANG WENGE
Format: Patent
Sprache:chi ; eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator XIE GUANGPING
XU XIXIANG
WANG WENHUI
WANG GUILIN
SUI DANNA
XU SIBIAO
ZHAO XIANZHONG
WANG WENGE
description
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN101173953A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN101173953A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN101173953A3</originalsourceid><addsrcrecordid>eNrjZFAJriwuSc1VSMxLUchNLcnIT1FIyy9SKE7MLcjJzEtXKEktLinmYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxzn6GBoaG5saWpsaOxsSoAQAG7Sa1</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>System and method for sampling tests</title><source>esp@cenet</source><creator>XIE GUANGPING ; XU XIXIANG ; WANG WENHUI ; WANG GUILIN ; SUI DANNA ; XU SIBIAO ; ZHAO XIANZHONG ; WANG WENGE</creator><creatorcontrib>XIE GUANGPING ; XU XIXIANG ; WANG WENHUI ; WANG GUILIN ; SUI DANNA ; XU SIBIAO ; ZHAO XIANZHONG ; WANG WENGE</creatorcontrib><language>chi ; eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2008</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20080507&amp;DB=EPODOC&amp;CC=CN&amp;NR=101173953A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20080507&amp;DB=EPODOC&amp;CC=CN&amp;NR=101173953A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>XIE GUANGPING</creatorcontrib><creatorcontrib>XU XIXIANG</creatorcontrib><creatorcontrib>WANG WENHUI</creatorcontrib><creatorcontrib>WANG GUILIN</creatorcontrib><creatorcontrib>SUI DANNA</creatorcontrib><creatorcontrib>XU SIBIAO</creatorcontrib><creatorcontrib>ZHAO XIANZHONG</creatorcontrib><creatorcontrib>WANG WENGE</creatorcontrib><title>System and method for sampling tests</title><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2008</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFAJriwuSc1VSMxLUchNLcnIT1FIyy9SKE7MLcjJzEtXKEktLinmYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxzn6GBoaG5saWpsaOxsSoAQAG7Sa1</recordid><startdate>20080507</startdate><enddate>20080507</enddate><creator>XIE GUANGPING</creator><creator>XU XIXIANG</creator><creator>WANG WENHUI</creator><creator>WANG GUILIN</creator><creator>SUI DANNA</creator><creator>XU SIBIAO</creator><creator>ZHAO XIANZHONG</creator><creator>WANG WENGE</creator><scope>EVB</scope></search><sort><creationdate>20080507</creationdate><title>System and method for sampling tests</title><author>XIE GUANGPING ; XU XIXIANG ; WANG WENHUI ; WANG GUILIN ; SUI DANNA ; XU SIBIAO ; ZHAO XIANZHONG ; WANG WENGE</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN101173953A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2008</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>XIE GUANGPING</creatorcontrib><creatorcontrib>XU XIXIANG</creatorcontrib><creatorcontrib>WANG WENHUI</creatorcontrib><creatorcontrib>WANG GUILIN</creatorcontrib><creatorcontrib>SUI DANNA</creatorcontrib><creatorcontrib>XU SIBIAO</creatorcontrib><creatorcontrib>ZHAO XIANZHONG</creatorcontrib><creatorcontrib>WANG WENGE</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>XIE GUANGPING</au><au>XU XIXIANG</au><au>WANG WENHUI</au><au>WANG GUILIN</au><au>SUI DANNA</au><au>XU SIBIAO</au><au>ZHAO XIANZHONG</au><au>WANG WENGE</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>System and method for sampling tests</title><date>2008-05-07</date><risdate>2008</risdate><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language chi ; eng
recordid cdi_epo_espacenet_CN101173953A
source esp@cenet
subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title System and method for sampling tests
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-24T22%3A35%3A24IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=XIE%20GUANGPING&rft.date=2008-05-07&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN101173953A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true