$Critical refraction longitudinal wave detection component inside tangential stress assistant device$

Critical refraction longitudinal wave detection component inside tangential stress assistant device

The utility model discloses an auxiliary device of internal tangential stress for critical refraction longitudinal wave detecting components, which is characterized in that: the inclined surface of the lower part (1) upward presents a concave cylindrical surface (3) and the inclined surface of the u...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	GUO HUI, DING JIEXIONG, LI JIANGEN, YANG XIUHAO, MOU PING, DAI XIANJIN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Schreiben Sie den ersten Kommentar!