Method and apparatus for detecting defects in a continuously moving strip of transparent material
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | WEBER JOACHIM,GERSTNER KLAUS |
| description | |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN100350236CC</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN100350236CC</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN100350236CC3</originalsourceid><addsrcrecordid>eNqNjDEKAjEQRbexEPUOg70QXfQCYcVGK_tlyE40kJ0JyUTw9kbwABaf__g8_rLDK-lTJkBuSQkzai3gJcNESk4DPxr5RgUCA4ITbmOVWuIbZnl9haI5JBAPmpFLOyFWmFEpB4zrbuExFtr8etVtz8PdXnaUZKRmO2LS0d72xvRHc-hP1vZ_SR-3iT6p</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method and apparatus for detecting defects in a continuously moving strip of transparent material</title><source>esp@cenet</source><creator>WEBER JOACHIM,GERSTNER KLAUS</creator><creatorcontrib>WEBER JOACHIM,GERSTNER KLAUS</creatorcontrib><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2007</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20071121&DB=EPODOC&CC=CN&NR=100350236C$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76418</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20071121&DB=EPODOC&CC=CN&NR=100350236C$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>WEBER JOACHIM,GERSTNER KLAUS</creatorcontrib><title>Method and apparatus for detecting defects in a continuously moving strip of transparent material</title><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2007</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjDEKAjEQRbexEPUOg70QXfQCYcVGK_tlyE40kJ0JyUTw9kbwABaf__g8_rLDK-lTJkBuSQkzai3gJcNESk4DPxr5RgUCA4ITbmOVWuIbZnl9haI5JBAPmpFLOyFWmFEpB4zrbuExFtr8etVtz8PdXnaUZKRmO2LS0d72xvRHc-hP1vZ_SR-3iT6p</recordid><startdate>20071121</startdate><enddate>20071121</enddate><creator>WEBER JOACHIM,GERSTNER KLAUS</creator><scope>EVB</scope></search><sort><creationdate>20071121</creationdate><title>Method and apparatus for detecting defects in a continuously moving strip of transparent material</title><author>WEBER JOACHIM,GERSTNER KLAUS</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN100350236CC3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2007</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>WEBER JOACHIM,GERSTNER KLAUS</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>WEBER JOACHIM,GERSTNER KLAUS</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method and apparatus for detecting defects in a continuously moving strip of transparent material</title><date>2007-11-21</date><risdate>2007</risdate><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_CN100350236CC |
| source | esp@cenet |
| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | Method and apparatus for detecting defects in a continuously moving strip of transparent material |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-08T19%3A08%3A31IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=WEBER%20JOACHIM,GERSTNER%20KLAUS&rft.date=2007-11-21&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN100350236CC%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |