Apparatus for the automatic inspection of the periphery of an article having an axis of symmetry
The apparatus for automatically inspecting machined articles must allow inspection of all the articles of a batch and comprises a transparent plate (5) mounted on a rotating table (1). The article to be tested is placed in a groove in the plate (5), within a light beam (14) emitted by a source (15)....
Gespeichert in:
Hauptverfasser: | , , , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | JOHN RONALD PARKS DONALD ATKINSON BELL ROBERT LEWIS WANEK BERNARD JOHN CHORLEY |
description | The apparatus for automatically inspecting machined articles must allow inspection of all the articles of a batch and comprises a transparent plate (5) mounted on a rotating table (1). The article to be tested is placed in a groove in the plate (5), within a light beam (14) emitted by a source (15). A line (34) of detectors scans an image of the article. The result of this scanning is transmitted to a computational device (CP) which defines the positions of the edges of the shadow of the article. By slowly rotating the table (1), the image of the article is sequentially scanned, and the computational device (CP) can indicate the length, width or axial curvature of the article. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CH610655A5</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CH610655A5</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CH610655A53</originalsourceid><addsrcrecordid>eNqFikEKwjAQAHPxIOob3A8IiqT3Uip9gPe6hI0JNMmSbMX8Xlu8exqYma16tMyYUeYCNmUQR4CzpIDiDfhYmIz4FCHZtTFlz45yXQRGwPz9JgKHLx-fq3n7ssRSQyDJda82FqdChx936njr791wIk4jFUZDkWTshuZybrRu9fX_8QHQyDxh</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Apparatus for the automatic inspection of the periphery of an article having an axis of symmetry</title><source>esp@cenet</source><creator>JOHN RONALD PARKS ; DONALD ATKINSON BELL ; ROBERT LEWIS WANEK ; BERNARD JOHN CHORLEY</creator><creatorcontrib>JOHN RONALD PARKS ; DONALD ATKINSON BELL ; ROBERT LEWIS WANEK ; BERNARD JOHN CHORLEY</creatorcontrib><description>The apparatus for automatically inspecting machined articles must allow inspection of all the articles of a batch and comprises a transparent plate (5) mounted on a rotating table (1). The article to be tested is placed in a groove in the plate (5), within a light beam (14) emitted by a source (15). A line (34) of detectors scans an image of the article. The result of this scanning is transmitted to a computational device (CP) which defines the positions of the edges of the shadow of the article. By slowly rotating the table (1), the image of the article is sequentially scanned, and the computational device (CP) can indicate the length, width or axial curvature of the article.</description><language>eng</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>1979</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19790430&DB=EPODOC&CC=CH&NR=610655A5$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76294</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19790430&DB=EPODOC&CC=CH&NR=610655A5$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>JOHN RONALD PARKS</creatorcontrib><creatorcontrib>DONALD ATKINSON BELL</creatorcontrib><creatorcontrib>ROBERT LEWIS WANEK</creatorcontrib><creatorcontrib>BERNARD JOHN CHORLEY</creatorcontrib><title>Apparatus for the automatic inspection of the periphery of an article having an axis of symmetry</title><description>The apparatus for automatically inspecting machined articles must allow inspection of all the articles of a batch and comprises a transparent plate (5) mounted on a rotating table (1). The article to be tested is placed in a groove in the plate (5), within a light beam (14) emitted by a source (15). A line (34) of detectors scans an image of the article. The result of this scanning is transmitted to a computational device (CP) which defines the positions of the edges of the shadow of the article. By slowly rotating the table (1), the image of the article is sequentially scanned, and the computational device (CP) can indicate the length, width or axial curvature of the article.</description><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1979</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqFikEKwjAQAHPxIOob3A8IiqT3Uip9gPe6hI0JNMmSbMX8Xlu8exqYma16tMyYUeYCNmUQR4CzpIDiDfhYmIz4FCHZtTFlz45yXQRGwPz9JgKHLx-fq3n7ssRSQyDJda82FqdChx936njr791wIk4jFUZDkWTshuZybrRu9fX_8QHQyDxh</recordid><startdate>19790430</startdate><enddate>19790430</enddate><creator>JOHN RONALD PARKS</creator><creator>DONALD ATKINSON BELL</creator><creator>ROBERT LEWIS WANEK</creator><creator>BERNARD JOHN CHORLEY</creator><scope>EVB</scope></search><sort><creationdate>19790430</creationdate><title>Apparatus for the automatic inspection of the periphery of an article having an axis of symmetry</title><author>JOHN RONALD PARKS ; DONALD ATKINSON BELL ; ROBERT LEWIS WANEK ; BERNARD JOHN CHORLEY</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CH610655A53</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1979</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>JOHN RONALD PARKS</creatorcontrib><creatorcontrib>DONALD ATKINSON BELL</creatorcontrib><creatorcontrib>ROBERT LEWIS WANEK</creatorcontrib><creatorcontrib>BERNARD JOHN CHORLEY</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>JOHN RONALD PARKS</au><au>DONALD ATKINSON BELL</au><au>ROBERT LEWIS WANEK</au><au>BERNARD JOHN CHORLEY</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Apparatus for the automatic inspection of the periphery of an article having an axis of symmetry</title><date>1979-04-30</date><risdate>1979</risdate><abstract>The apparatus for automatically inspecting machined articles must allow inspection of all the articles of a batch and comprises a transparent plate (5) mounted on a rotating table (1). The article to be tested is placed in a groove in the plate (5), within a light beam (14) emitted by a source (15). A line (34) of detectors scans an image of the article. The result of this scanning is transmitted to a computational device (CP) which defines the positions of the edges of the shadow of the article. By slowly rotating the table (1), the image of the article is sequentially scanned, and the computational device (CP) can indicate the length, width or axial curvature of the article.</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng |
recordid | cdi_epo_espacenet_CH610655A5 |
source | esp@cenet |
subjects | MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
title | Apparatus for the automatic inspection of the periphery of an article having an axis of symmetry |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-22T08%3A48%3A05IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=JOHN%20RONALD%20PARKS&rft.date=1979-04-30&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECH610655A5%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |