GRAIN FLAKE MEASUREMENT SYSTEM, GRAIN FLAKE MEASUREMENT METHOD, AND GRAIN FLAKE COLLECTION, MOVEMENT, AND MEASUREMENT SYSTEM

This invention describes a measurement system (100), a measurement method, and a collection, movement, and measurement system for grains (200) run through a flaking process, in order to define the grain flake thickness. The grain flake measurement system comprises: an image collection device (110) c...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	MONTEIRO VERAS, RAFAEL, OLIVEIRA CABECA NEVES, CARLOS FERNANDO, BONNARD, RENAN, MOLGARO, ANDRE LUIS, SEIBERT, ARTUR ANTONIO, OLIVEIRA BARBOSA, FLAVIO GABRIEL
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS
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