X-RAY FLUORESCENCE ANALYSER, AND A METHOD FOR PERFORMING X-RAY FLUORESCENCE ANALYSIS
An X-ray fluorescence analyser comprises an X-ray tube (402) for emitting incident X-rays (206) in the direction of a first optical axis (204). A slurry handling unit (201) is configured to maintain a constant distance between a sample (202) of slurry and said X-ray tube. A first crystal diffractor...
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| creator | SIPILA, HEIKKI PELLI, ANTTI KOSKINEN, TOMMI |
| description | An X-ray fluorescence analyser comprises an X-ray tube (402) for emitting incident X-rays (206) in the direction of a first optical axis (204). A slurry handling unit (201) is configured to maintain a constant distance between a sample (202) of slurry and said X-ray tube. A first crystal diffractor (601) is located in a first direction from said slurry handling unit (201), and configured to separate a predefined first wavelength range from fluorescent X-rays (207) that propagate into said first direction. It is configured to direct the fluorescent X-rays in the separated predefined first wavelength range to a first radiation detector (602, 505). The input power rating of said X-ray tube (402) is at least 400 watts. The first crystal diffractor (601) comprises a pyrolytic graphite crystal (603). The optical path between said X-ray tube (402) and said slurry handling unit (201) is direct with no diffractor therebetween.
La présente invention concerne un analyseur de fluorescence X qui comprend un tube à rayons X (402) pour émettre des rayons X incidents (206) dans la direction d'un premier axe optique (204). Une unité de manipulation de bouillie (201) est conçue pour maintenir une distance constante entre un échantillon (202) de bouillie et ledit tube à rayons X. Un premier diffracteur à cristaux (601) est situé dans une première direction à partir de ladite unité de manipulation de bouillie (201), et conçu pour séparer une première gamme de longueurs d'onde prédéfinie de rayons X fluorescents (207) qui se propagent dans ladite première direction. Il est conçu pour diriger les rayons X fluorescents dans la première gamme de longueurs d'onde prédéfinie séparée vers un premier détecteur de rayonnement (602, 505). La puissance nominale d'entrée du tube à rayons X (402) est d'au moins 400 watts. Le premier diffracteur à cristaux (601) comprend un cristal de graphite pyrolytique (603). Le trajet optique entre ledit tube à rayons X (402) et ladite unité de manipulation de bouillie (201) est direct sans aucun diffracteur entre eux. |
| format | Patent |
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La présente invention concerne un analyseur de fluorescence X qui comprend un tube à rayons X (402) pour émettre des rayons X incidents (206) dans la direction d'un premier axe optique (204). Une unité de manipulation de bouillie (201) est conçue pour maintenir une distance constante entre un échantillon (202) de bouillie et ledit tube à rayons X. Un premier diffracteur à cristaux (601) est situé dans une première direction à partir de ladite unité de manipulation de bouillie (201), et conçu pour séparer une première gamme de longueurs d'onde prédéfinie de rayons X fluorescents (207) qui se propagent dans ladite première direction. Il est conçu pour diriger les rayons X fluorescents dans la première gamme de longueurs d'onde prédéfinie séparée vers un premier détecteur de rayonnement (602, 505). La puissance nominale d'entrée du tube à rayons X (402) est d'au moins 400 watts. Le premier diffracteur à cristaux (601) comprend un cristal de graphite pyrolytique (603). Le trajet optique entre ledit tube à rayons X (402) et ladite unité de manipulation de bouillie (201) est direct sans aucun diffracteur entre eux.</description><language>eng ; fre</language><subject>CHEMISTRY ; FERROUS OR NON-FERROUS ALLOYS ; GAMMA RAY OR X-RAY MICROSCOPES ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; IRRADIATION DEVICES ; MAGNETIC OR ELECTROSTATIC SEPARATION OF SOLID MATERIALS FROM SOLIDMATERIALS OR FLUIDS ; MEASUREMENT OF NUCLEAR OR X-RADIATION ; MEASURING ; METALLURGY ; NUCLEAR ENGINEERING ; NUCLEAR PHYSICS ; PERFORMING OPERATIONS ; PHYSICS ; PRETREATMENT OF RAW MATERIALS ; PRODUCTION AND REFINING OF METALS ; SEPARATING SOLID MATERIALS USING LIQUIDS OR USING PNEUMATICTABLES OR JIGS ; SEPARATION BY HIGH-VOLTAGE ELECTRIC FIELDS ; SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATICTABLES OR JIGS ; TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR ; TESTING ; TRANSPORTING ; TREATMENT OF ALLOYS OR NON-FERROUS METALS</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230905&DB=EPODOC&CC=CA&NR=3097462C$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230905&DB=EPODOC&CC=CA&NR=3097462C$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SIPILA, HEIKKI</creatorcontrib><creatorcontrib>PELLI, ANTTI</creatorcontrib><creatorcontrib>KOSKINEN, TOMMI</creatorcontrib><title>X-RAY FLUORESCENCE ANALYSER, AND A METHOD FOR PERFORMING X-RAY FLUORESCENCE ANALYSIS</title><description>An X-ray fluorescence analyser comprises an X-ray tube (402) for emitting incident X-rays (206) in the direction of a first optical axis (204). A slurry handling unit (201) is configured to maintain a constant distance between a sample (202) of slurry and said X-ray tube. A first crystal diffractor (601) is located in a first direction from said slurry handling unit (201), and configured to separate a predefined first wavelength range from fluorescent X-rays (207) that propagate into said first direction. It is configured to direct the fluorescent X-rays in the separated predefined first wavelength range to a first radiation detector (602, 505). The input power rating of said X-ray tube (402) is at least 400 watts. The first crystal diffractor (601) comprises a pyrolytic graphite crystal (603). The optical path between said X-ray tube (402) and said slurry handling unit (201) is direct with no diffractor therebetween.
La présente invention concerne un analyseur de fluorescence X qui comprend un tube à rayons X (402) pour émettre des rayons X incidents (206) dans la direction d'un premier axe optique (204). Une unité de manipulation de bouillie (201) est conçue pour maintenir une distance constante entre un échantillon (202) de bouillie et ledit tube à rayons X. Un premier diffracteur à cristaux (601) est situé dans une première direction à partir de ladite unité de manipulation de bouillie (201), et conçu pour séparer une première gamme de longueurs d'onde prédéfinie de rayons X fluorescents (207) qui se propagent dans ladite première direction. Il est conçu pour diriger les rayons X fluorescents dans la première gamme de longueurs d'onde prédéfinie séparée vers un premier détecteur de rayonnement (602, 505). La puissance nominale d'entrée du tube à rayons X (402) est d'au moins 400 watts. Le premier diffracteur à cristaux (601) comprend un cristal de graphite pyrolytique (603). Le trajet optique entre ledit tube à rayons X (402) et ladite unité de manipulation de bouillie (201) est direct sans aucun diffracteur entre eux.</description><subject>CHEMISTRY</subject><subject>FERROUS OR NON-FERROUS ALLOYS</subject><subject>GAMMA RAY OR X-RAY MICROSCOPES</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>IRRADIATION DEVICES</subject><subject>MAGNETIC OR ELECTROSTATIC SEPARATION OF SOLID MATERIALS FROM SOLIDMATERIALS OR FLUIDS</subject><subject>MEASUREMENT OF NUCLEAR OR X-RADIATION</subject><subject>MEASURING</subject><subject>METALLURGY</subject><subject>NUCLEAR ENGINEERING</subject><subject>NUCLEAR PHYSICS</subject><subject>PERFORMING OPERATIONS</subject><subject>PHYSICS</subject><subject>PRETREATMENT OF RAW MATERIALS</subject><subject>PRODUCTION AND REFINING OF METALS</subject><subject>SEPARATING SOLID MATERIALS USING LIQUIDS OR USING PNEUMATICTABLES OR JIGS</subject><subject>SEPARATION BY HIGH-VOLTAGE ELECTRIC FIELDS</subject><subject>SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATICTABLES OR JIGS</subject><subject>TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR</subject><subject>TESTING</subject><subject>TRANSPORTING</subject><subject>TREATMENT OF ALLOYS OR NON-FERROUS METALS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZAiJ0A1yjFRw8wn1D3INdnb1c3ZVcPRz9IkMdg3SAbJcFBwVfF1DPPxdFNz8gxQCXIOAlK-nn7sCTo2ewTwMrGmJOcWpvFCam0HezTXE2UM3tSA_PrW4IDE5NS-1JN7Z0djA0tzEzMjZmLAKAFrCLyE</recordid><startdate>20230905</startdate><enddate>20230905</enddate><creator>SIPILA, HEIKKI</creator><creator>PELLI, ANTTI</creator><creator>KOSKINEN, TOMMI</creator><scope>EVB</scope></search><sort><creationdate>20230905</creationdate><title>X-RAY FLUORESCENCE ANALYSER, AND A METHOD FOR PERFORMING X-RAY FLUORESCENCE ANALYSIS</title><author>SIPILA, HEIKKI ; PELLI, ANTTI ; KOSKINEN, TOMMI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CA3097462C3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre</language><creationdate>2023</creationdate><topic>CHEMISTRY</topic><topic>FERROUS OR NON-FERROUS ALLOYS</topic><topic>GAMMA RAY OR X-RAY MICROSCOPES</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>IRRADIATION DEVICES</topic><topic>MAGNETIC OR ELECTROSTATIC SEPARATION OF SOLID MATERIALS FROM SOLIDMATERIALS OR FLUIDS</topic><topic>MEASUREMENT OF NUCLEAR OR X-RADIATION</topic><topic>MEASURING</topic><topic>METALLURGY</topic><topic>NUCLEAR ENGINEERING</topic><topic>NUCLEAR PHYSICS</topic><topic>PERFORMING OPERATIONS</topic><topic>PHYSICS</topic><topic>PRETREATMENT OF RAW MATERIALS</topic><topic>PRODUCTION AND REFINING OF METALS</topic><topic>SEPARATING SOLID MATERIALS USING LIQUIDS OR USING PNEUMATICTABLES OR JIGS</topic><topic>SEPARATION BY HIGH-VOLTAGE ELECTRIC FIELDS</topic><topic>SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATICTABLES OR JIGS</topic><topic>TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR</topic><topic>TESTING</topic><topic>TRANSPORTING</topic><topic>TREATMENT OF ALLOYS OR NON-FERROUS METALS</topic><toplevel>online_resources</toplevel><creatorcontrib>SIPILA, HEIKKI</creatorcontrib><creatorcontrib>PELLI, ANTTI</creatorcontrib><creatorcontrib>KOSKINEN, TOMMI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SIPILA, HEIKKI</au><au>PELLI, ANTTI</au><au>KOSKINEN, TOMMI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>X-RAY FLUORESCENCE ANALYSER, AND A METHOD FOR PERFORMING X-RAY FLUORESCENCE ANALYSIS</title><date>2023-09-05</date><risdate>2023</risdate><abstract>An X-ray fluorescence analyser comprises an X-ray tube (402) for emitting incident X-rays (206) in the direction of a first optical axis (204). A slurry handling unit (201) is configured to maintain a constant distance between a sample (202) of slurry and said X-ray tube. A first crystal diffractor (601) is located in a first direction from said slurry handling unit (201), and configured to separate a predefined first wavelength range from fluorescent X-rays (207) that propagate into said first direction. It is configured to direct the fluorescent X-rays in the separated predefined first wavelength range to a first radiation detector (602, 505). The input power rating of said X-ray tube (402) is at least 400 watts. The first crystal diffractor (601) comprises a pyrolytic graphite crystal (603). The optical path between said X-ray tube (402) and said slurry handling unit (201) is direct with no diffractor therebetween.
La présente invention concerne un analyseur de fluorescence X qui comprend un tube à rayons X (402) pour émettre des rayons X incidents (206) dans la direction d'un premier axe optique (204). Une unité de manipulation de bouillie (201) est conçue pour maintenir une distance constante entre un échantillon (202) de bouillie et ledit tube à rayons X. Un premier diffracteur à cristaux (601) est situé dans une première direction à partir de ladite unité de manipulation de bouillie (201), et conçu pour séparer une première gamme de longueurs d'onde prédéfinie de rayons X fluorescents (207) qui se propagent dans ladite première direction. Il est conçu pour diriger les rayons X fluorescents dans la première gamme de longueurs d'onde prédéfinie séparée vers un premier détecteur de rayonnement (602, 505). La puissance nominale d'entrée du tube à rayons X (402) est d'au moins 400 watts. Le premier diffracteur à cristaux (601) comprend un cristal de graphite pyrolytique (603). Le trajet optique entre ledit tube à rayons X (402) et ladite unité de manipulation de bouillie (201) est direct sans aucun diffracteur entre eux.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | CHEMISTRY FERROUS OR NON-FERROUS ALLOYS GAMMA RAY OR X-RAY MICROSCOPES INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES IRRADIATION DEVICES MAGNETIC OR ELECTROSTATIC SEPARATION OF SOLID MATERIALS FROM SOLIDMATERIALS OR FLUIDS MEASUREMENT OF NUCLEAR OR X-RADIATION MEASURING METALLURGY NUCLEAR ENGINEERING NUCLEAR PHYSICS PERFORMING OPERATIONS PHYSICS PRETREATMENT OF RAW MATERIALS PRODUCTION AND REFINING OF METALS SEPARATING SOLID MATERIALS USING LIQUIDS OR USING PNEUMATICTABLES OR JIGS SEPARATION BY HIGH-VOLTAGE ELECTRIC FIELDS SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATICTABLES OR JIGS TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR TESTING TRANSPORTING TREATMENT OF ALLOYS OR NON-FERROUS METALS |
| title | X-RAY FLUORESCENCE ANALYSER, AND A METHOD FOR PERFORMING X-RAY FLUORESCENCE ANALYSIS |
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