LIDAR BASED 3-D IMAGING WITH FAR-FIELD ILLUMINATION OVERLAP

Methods and systems for performing 3-D LIDAR measurements of objects simultaneously illuminated by two or more beams of light in the far field are described herein. A 3-D LIDAR based measurement device simultaneously emits at least two beams of light into a three dimensional environment from differe...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: KERSTENS, PIETER J, HALL, DAVID S, REKOW, MATHEW NOEL
Format: Patent
Sprache:eng ; fre
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!