LIDAR BASED 3-D IMAGING WITH FAR-FIELD ILLUMINATION OVERLAP
Methods and systems for performing 3-D LIDAR measurements of objects simultaneously illuminated by two or more beams of light in the far field are described herein. A 3-D LIDAR based measurement device simultaneously emits at least two beams of light into a three dimensional environment from differe...
Gespeichert in:
Hauptverfasser: | , , |
---|---|
Format: | Patent |
Sprache: | eng ; fre |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Schreiben Sie den ersten Kommentar!