FIXTURE TO SUPPORT REEL-TO-REEL INSPECTION OF SEMICONDUCTOR DEVICES OR OTHER COMPONENTS

A system includes a component inspection system (200) having a radiation source (202) configured to generate radiation and a radiation detector (204) configured to detect the radiation after the radiation passes through components to be inspected. The system also includes a fixture (100) configured...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	FASOLINO, STEPHEN T, WHEELER, JASON L, NG, JOSHUA
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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