HIGH PRESSURE UTILIZATION OF QUARTZ CRYSTAL MICROBALANCE

HIGH PRESSURE UTILIZATION OF QUARTZ CRYSTAL MICROBALANCE

A QCM sensor apparatus comprising a QCM mounting insert having a first opening, a second opening, and a barrier fluid chamber disposed between the first opening and the second opening, and a QCM wafer sealably coupled to the second opening, wherein the QCM wafer has an electrode contact exposed to t...

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Hauptverfasser: LACHANCE, JASON, W, SPITZENBERGER, JEFFREY, D
Format: Patent
Sprache:eng ; fre
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
WEIGHING
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creator LACHANCE, JASON, W
SPITZENBERGER, JEFFREY, D
description A QCM sensor apparatus comprising a QCM mounting insert having a first opening, a second opening, and a barrier fluid chamber disposed between the first opening and the second opening, and a QCM wafer sealably coupled to the second opening, wherein the QCM wafer has an electrode contact exposed to the barrier fluid chamber and a sensitive layer that is not exposed to the barrier fluid chamber.
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
WEIGHING
title HIGH PRESSURE UTILIZATION OF QUARTZ CRYSTAL MICROBALANCE
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