SYSTEM FOR CALCULATION OF MATERIAL PROPERTIES USING REFLECTION TERAHERTZ RADIATION AND AN EXTERNAL REFERENCE STRUCTURE

A system for interpreting terahertz radiation includes a terahertz transmitter configured to output a pulse of terahertz radiation and a terahertz receiver configured to receive at least a portion of the pulse of radiation from the terahertz transmitter. The terahertz receiver is configured to outpu...

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Bibliographische Detailangaben
Hauptverfasser: ZIMDARS, DAVID, WHITE, JEFFREY S
Format: Patent
Sprache:eng ; fre
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