DETECTION OF DEFECTS IN AN ELECTROCHEMICAL DEVICE
L'invention concerne un procédé de détection de défauts d'un dispositif électrochimique comprenant l'obtention (103) d'au moins une valeur caractéristique (VaIi) dépendant d'au moins une grandeur (S) reçue dudit dispositif électrochimique et la détermination (105) d'au...
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| creator | YOUSFISTEINER, NADIA MOCOTEGUY, PHILIPPE HISSEL, DANIEL CANDUSSO, DENIS GAUTIER, LUDMILA |
| description | L'invention concerne un procédé de détection de défauts d'un dispositif électrochimique comprenant l'obtention (103) d'au moins une valeur caractéristique (VaIi) dépendant d'au moins une grandeur (S) reçue dudit dispositif électrochimique et la détermination (105) d'au moins un défaut (Di) dudit dispositif à partir de ladite valeur caractéristique obtenue. Dans ce procédé, une opération mathématique comprenant une transformation en ondelettes est réalisée pour obtenir la valeur caractéristique (VaIi) à partir de la grandeur (S) reçue. L'invention concerne également un dispositif mettant en uvre un tel procédé ainsi qu'un programme informatique correspondant.
A method for detecting defects in an electrochemical device, including obtaining at least one characteristic value dependent on at least one variable received from the electrochemical device and determining at least one defect in said device from the characteristic value obtained. The method comprises a mathematical operation including a wavelet transform, which operation is carried out in order to obtain the characteristic value from the variable received. The invention also relates to a device that carries out one such method, as well as to a corresponding computer program. |
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A method for detecting defects in an electrochemical device, including obtaining at least one characteristic value dependent on at least one variable received from the electrochemical device and determining at least one defect in said device from the characteristic value obtained. The method comprises a mathematical operation including a wavelet transform, which operation is carried out in order to obtain the characteristic value from the variable received. The invention also relates to a device that carries out one such method, as well as to a corresponding computer program.</description><language>eng ; fre</language><subject>BASIC ELECTRIC ELEMENTS ; CALCULATING ; CAPACITORS ; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES ORLIGHT-SENSITIVE DEVICES, OF THE ELECTROLYTIC TYPE ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; ELECTRICITY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSIONOF CHEMICAL INTO ELECTRICAL ENERGY ; TESTING</subject><creationdate>2010</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20101229&DB=EPODOC&CC=CA&NR=2766481A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20101229&DB=EPODOC&CC=CA&NR=2766481A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>YOUSFISTEINER, NADIA</creatorcontrib><creatorcontrib>MOCOTEGUY, PHILIPPE</creatorcontrib><creatorcontrib>HISSEL, DANIEL</creatorcontrib><creatorcontrib>CANDUSSO, DENIS</creatorcontrib><creatorcontrib>GAUTIER, LUDMILA</creatorcontrib><title>DETECTION OF DEFECTS IN AN ELECTROCHEMICAL DEVICE</title><description>L'invention concerne un procédé de détection de défauts d'un dispositif électrochimique comprenant l'obtention (103) d'au moins une valeur caractéristique (VaIi) dépendant d'au moins une grandeur (S) reçue dudit dispositif électrochimique et la détermination (105) d'au moins un défaut (Di) dudit dispositif à partir de ladite valeur caractéristique obtenue. Dans ce procédé, une opération mathématique comprenant une transformation en ondelettes est réalisée pour obtenir la valeur caractéristique (VaIi) à partir de la grandeur (S) reçue. L'invention concerne également un dispositif mettant en uvre un tel procédé ainsi qu'un programme informatique correspondant.
A method for detecting defects in an electrochemical device, including obtaining at least one characteristic value dependent on at least one variable received from the electrochemical device and determining at least one defect in said device from the characteristic value obtained. The method comprises a mathematical operation including a wavelet transform, which operation is carried out in order to obtain the characteristic value from the variable received. The invention also relates to a device that carries out one such method, as well as to a corresponding computer program.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CALCULATING</subject><subject>CAPACITORS</subject><subject>CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES ORLIGHT-SENSITIVE DEVICES, OF THE ELECTROLYTIC TYPE</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>ELECTRICITY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSIONOF CHEMICAL INTO ELECTRICAL ENERGY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2010</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDB0cQ1xdQ7x9PdT8HdTcHF1A3KCFTz9FBz9FFx9gJwgf2cPV19PZ0cfoGyYp7MrDwNrWmJOcSovlOZmUHBzDXH20E0tyI9PLS5ITE7NSy2Jd3Y0MjczM7EwdDQ0JkIJANqiJa4</recordid><startdate>20101229</startdate><enddate>20101229</enddate><creator>YOUSFISTEINER, NADIA</creator><creator>MOCOTEGUY, PHILIPPE</creator><creator>HISSEL, DANIEL</creator><creator>CANDUSSO, DENIS</creator><creator>GAUTIER, LUDMILA</creator><scope>EVB</scope></search><sort><creationdate>20101229</creationdate><title>DETECTION OF DEFECTS IN AN ELECTROCHEMICAL DEVICE</title><author>YOUSFISTEINER, NADIA ; MOCOTEGUY, PHILIPPE ; HISSEL, DANIEL ; CANDUSSO, DENIS ; GAUTIER, LUDMILA</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CA2766481A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre</language><creationdate>2010</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CALCULATING</topic><topic>CAPACITORS</topic><topic>CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES ORLIGHT-SENSITIVE DEVICES, OF THE ELECTROLYTIC TYPE</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>ELECTRICITY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSIONOF CHEMICAL INTO ELECTRICAL ENERGY</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>YOUSFISTEINER, NADIA</creatorcontrib><creatorcontrib>MOCOTEGUY, PHILIPPE</creatorcontrib><creatorcontrib>HISSEL, DANIEL</creatorcontrib><creatorcontrib>CANDUSSO, DENIS</creatorcontrib><creatorcontrib>GAUTIER, LUDMILA</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>YOUSFISTEINER, NADIA</au><au>MOCOTEGUY, PHILIPPE</au><au>HISSEL, DANIEL</au><au>CANDUSSO, DENIS</au><au>GAUTIER, LUDMILA</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>DETECTION OF DEFECTS IN AN ELECTROCHEMICAL DEVICE</title><date>2010-12-29</date><risdate>2010</risdate><abstract>L'invention concerne un procédé de détection de défauts d'un dispositif électrochimique comprenant l'obtention (103) d'au moins une valeur caractéristique (VaIi) dépendant d'au moins une grandeur (S) reçue dudit dispositif électrochimique et la détermination (105) d'au moins un défaut (Di) dudit dispositif à partir de ladite valeur caractéristique obtenue. Dans ce procédé, une opération mathématique comprenant une transformation en ondelettes est réalisée pour obtenir la valeur caractéristique (VaIi) à partir de la grandeur (S) reçue. L'invention concerne également un dispositif mettant en uvre un tel procédé ainsi qu'un programme informatique correspondant.
A method for detecting defects in an electrochemical device, including obtaining at least one characteristic value dependent on at least one variable received from the electrochemical device and determining at least one defect in said device from the characteristic value obtained. The method comprises a mathematical operation including a wavelet transform, which operation is carried out in order to obtain the characteristic value from the variable received. The invention also relates to a device that carries out one such method, as well as to a corresponding computer program.</abstract><oa>free_for_read</oa></addata></record> |
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| language | eng ; fre |
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| subjects | BASIC ELECTRIC ELEMENTS CALCULATING CAPACITORS CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES ORLIGHT-SENSITIVE DEVICES, OF THE ELECTROLYTIC TYPE COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSIONOF CHEMICAL INTO ELECTRICAL ENERGY TESTING |
| title | DETECTION OF DEFECTS IN AN ELECTROCHEMICAL DEVICE |
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