WAVEFRONT ANALYSIS METHOD INVOLVING MULTILATERAL INTERFEROMETRY WITH FREQUENCY DIFFERENCE

The invention relates to a wavefront analysis method involving multilateral interferometry with frequency difference. According to the invention, a diffraction grating (GR) with two-dimensional meshing is placed on the path of the beam to be analysed and at least two interferograms with at least two...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	TAUVY, MICHEL, GUERINEAU, NICOLAS, HAIEDAR, RIAD, PRIMOT, JEROME, VELGHE, SABRINA
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	COLORIMETRY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS RADIATION PYROMETRY TESTING
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