TONER HAVING CRYSTALLINE WAX
Embodiments include a toner with a distilled wax having a crystallinity of from about 55 to about 100 percent, wherein the degree of crystallinity is calculated using the following formulas: [Heat of enthalpy (Hm) J/g / 294 J/g] × 100 = degree of crystallinity (Xc); [Heat of recrystallization (Hrc)...
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| creator | SANDERS, DAVID J LINCOLN, TIMOTHY L MARCELL, KEVIN F HADZIDEDIC, SONJA GARDNER, SANDRA J ISGANITIS, LOUIS V NG, TIE HWEE PATEL, RAJ D DRAPPEL, STEPHAN V |
| description | Embodiments include a toner with a distilled wax having a crystallinity of from about 55 to about 100 percent, wherein the degree of crystallinity is calculated using the following formulas: [Heat of enthalpy (Hm) J/g / 294 J/g] × 100 = degree of crystallinity (Xc); [Heat of recrystallization (Hrc) J/g / 294 J/g] × 100 = degree of crystallinity (Xc); and Sc/(Sc+Sa)] × 100%, wherein Sc is a diffraction peak area of a crystalline component of the wax and the Sa is a diffraction peak area of an amorphous component of the wax; and wherein the Mp, Mn and Mw of the wax are all within the range of from about 500 to about 800, and wherein the wax has a polydispersity of from about 1 to about 1.05.
Parmi les réalisations, on retrouve une encre en poudre avec une cire distillée ayant une cristallinité d'environ 55 à environ 100 pour cent, dans laquelle le degré de cristallinité est calculé au moyen des formules suivantes : ¬Chaleur d'enthalpie (Hm) J/g /294 J/g| .fois. 100 = degré de crystallinité (Xc); ¬Chaleur de recristallisation (Hrc) J/g /294 J/g| .fois. 100 = degré de cristallinité (Xc); Sc/(Sc+Sa)| .fois. 100 %, dans laquelle Sc est la surface d'un pic de diffraction d'un composant cristallin de la cire et Sa est la surface d'un pic de diffraction d'un composant amorphe de la cire; et où Mp, Mn et Mw de la cire sont tous dans la gamme allant d'environ 500 à environ 800, et dans laquelle la cire a une polydispersité d'environ 1 à environ 1,05. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CA2567256C</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CA2567256C</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CA2567256C3</originalsourceid><addsrcrecordid>eNrjZJAJ8fdzDVLwcAzz9HNXcA6KDA5x9PHx9HNVCHeM4GFgTUvMKU7lhdLcDPJuriHOHrqpBfnxqcUFicmpeakl8c6ORqZm5kDsbExYBQD9xiAK</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>TONER HAVING CRYSTALLINE WAX</title><source>esp@cenet</source><creator>SANDERS, DAVID J ; LINCOLN, TIMOTHY L ; MARCELL, KEVIN F ; HADZIDEDIC, SONJA ; GARDNER, SANDRA J ; ISGANITIS, LOUIS V ; NG, TIE HWEE ; PATEL, RAJ D ; DRAPPEL, STEPHAN V</creator><creatorcontrib>SANDERS, DAVID J ; LINCOLN, TIMOTHY L ; MARCELL, KEVIN F ; HADZIDEDIC, SONJA ; GARDNER, SANDRA J ; ISGANITIS, LOUIS V ; NG, TIE HWEE ; PATEL, RAJ D ; DRAPPEL, STEPHAN V</creatorcontrib><description>Embodiments include a toner with a distilled wax having a crystallinity of from about 55 to about 100 percent, wherein the degree of crystallinity is calculated using the following formulas: [Heat of enthalpy (Hm) J/g / 294 J/g] × 100 = degree of crystallinity (Xc); [Heat of recrystallization (Hrc) J/g / 294 J/g] × 100 = degree of crystallinity (Xc); and Sc/(Sc+Sa)] × 100%, wherein Sc is a diffraction peak area of a crystalline component of the wax and the Sa is a diffraction peak area of an amorphous component of the wax; and wherein the Mp, Mn and Mw of the wax are all within the range of from about 500 to about 800, and wherein the wax has a polydispersity of from about 1 to about 1.05.
Parmi les réalisations, on retrouve une encre en poudre avec une cire distillée ayant une cristallinité d'environ 55 à environ 100 pour cent, dans laquelle le degré de cristallinité est calculé au moyen des formules suivantes : ¬Chaleur d'enthalpie (Hm) J/g /294 J/g| .fois. 100 = degré de crystallinité (Xc); ¬Chaleur de recristallisation (Hrc) J/g /294 J/g| .fois. 100 = degré de cristallinité (Xc); Sc/(Sc+Sa)| .fois. 100 %, dans laquelle Sc est la surface d'un pic de diffraction d'un composant cristallin de la cire et Sa est la surface d'un pic de diffraction d'un composant amorphe de la cire; et où Mp, Mn et Mw de la cire sont tous dans la gamme allant d'environ 500 à environ 800, et dans laquelle la cire a une polydispersité d'environ 1 à environ 1,05.</description><language>eng ; fre</language><subject>CINEMATOGRAPHY ; ELECTROGRAPHY ; ELECTROPHOTOGRAPHY ; HOLOGRAPHY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MAGNETOGRAPHY ; MEASURING ; PHOTOGRAPHY ; PHYSICS ; TESTING</subject><creationdate>2010</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20100928&DB=EPODOC&CC=CA&NR=2567256C$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20100928&DB=EPODOC&CC=CA&NR=2567256C$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SANDERS, DAVID J</creatorcontrib><creatorcontrib>LINCOLN, TIMOTHY L</creatorcontrib><creatorcontrib>MARCELL, KEVIN F</creatorcontrib><creatorcontrib>HADZIDEDIC, SONJA</creatorcontrib><creatorcontrib>GARDNER, SANDRA J</creatorcontrib><creatorcontrib>ISGANITIS, LOUIS V</creatorcontrib><creatorcontrib>NG, TIE HWEE</creatorcontrib><creatorcontrib>PATEL, RAJ D</creatorcontrib><creatorcontrib>DRAPPEL, STEPHAN V</creatorcontrib><title>TONER HAVING CRYSTALLINE WAX</title><description>Embodiments include a toner with a distilled wax having a crystallinity of from about 55 to about 100 percent, wherein the degree of crystallinity is calculated using the following formulas: [Heat of enthalpy (Hm) J/g / 294 J/g] × 100 = degree of crystallinity (Xc); [Heat of recrystallization (Hrc) J/g / 294 J/g] × 100 = degree of crystallinity (Xc); and Sc/(Sc+Sa)] × 100%, wherein Sc is a diffraction peak area of a crystalline component of the wax and the Sa is a diffraction peak area of an amorphous component of the wax; and wherein the Mp, Mn and Mw of the wax are all within the range of from about 500 to about 800, and wherein the wax has a polydispersity of from about 1 to about 1.05.
Parmi les réalisations, on retrouve une encre en poudre avec une cire distillée ayant une cristallinité d'environ 55 à environ 100 pour cent, dans laquelle le degré de cristallinité est calculé au moyen des formules suivantes : ¬Chaleur d'enthalpie (Hm) J/g /294 J/g| .fois. 100 = degré de crystallinité (Xc); ¬Chaleur de recristallisation (Hrc) J/g /294 J/g| .fois. 100 = degré de cristallinité (Xc); Sc/(Sc+Sa)| .fois. 100 %, dans laquelle Sc est la surface d'un pic de diffraction d'un composant cristallin de la cire et Sa est la surface d'un pic de diffraction d'un composant amorphe de la cire; et où Mp, Mn et Mw de la cire sont tous dans la gamme allant d'environ 500 à environ 800, et dans laquelle la cire a une polydispersité d'environ 1 à environ 1,05.</description><subject>CINEMATOGRAPHY</subject><subject>ELECTROGRAPHY</subject><subject>ELECTROPHOTOGRAPHY</subject><subject>HOLOGRAPHY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MAGNETOGRAPHY</subject><subject>MEASURING</subject><subject>PHOTOGRAPHY</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2010</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJAJ8fdzDVLwcAzz9HNXcA6KDA5x9PHx9HNVCHeM4GFgTUvMKU7lhdLcDPJuriHOHrqpBfnxqcUFicmpeakl8c6ORqZm5kDsbExYBQD9xiAK</recordid><startdate>20100928</startdate><enddate>20100928</enddate><creator>SANDERS, DAVID J</creator><creator>LINCOLN, TIMOTHY L</creator><creator>MARCELL, KEVIN F</creator><creator>HADZIDEDIC, SONJA</creator><creator>GARDNER, SANDRA J</creator><creator>ISGANITIS, LOUIS V</creator><creator>NG, TIE HWEE</creator><creator>PATEL, RAJ D</creator><creator>DRAPPEL, STEPHAN V</creator><scope>EVB</scope></search><sort><creationdate>20100928</creationdate><title>TONER HAVING CRYSTALLINE WAX</title><author>SANDERS, DAVID J ; LINCOLN, TIMOTHY L ; MARCELL, KEVIN F ; HADZIDEDIC, SONJA ; GARDNER, SANDRA J ; ISGANITIS, LOUIS V ; NG, TIE HWEE ; PATEL, RAJ D ; DRAPPEL, STEPHAN V</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CA2567256C3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre</language><creationdate>2010</creationdate><topic>CINEMATOGRAPHY</topic><topic>ELECTROGRAPHY</topic><topic>ELECTROPHOTOGRAPHY</topic><topic>HOLOGRAPHY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MAGNETOGRAPHY</topic><topic>MEASURING</topic><topic>PHOTOGRAPHY</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SANDERS, DAVID J</creatorcontrib><creatorcontrib>LINCOLN, TIMOTHY L</creatorcontrib><creatorcontrib>MARCELL, KEVIN F</creatorcontrib><creatorcontrib>HADZIDEDIC, SONJA</creatorcontrib><creatorcontrib>GARDNER, SANDRA J</creatorcontrib><creatorcontrib>ISGANITIS, LOUIS V</creatorcontrib><creatorcontrib>NG, TIE HWEE</creatorcontrib><creatorcontrib>PATEL, RAJ D</creatorcontrib><creatorcontrib>DRAPPEL, STEPHAN V</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SANDERS, DAVID J</au><au>LINCOLN, TIMOTHY L</au><au>MARCELL, KEVIN F</au><au>HADZIDEDIC, SONJA</au><au>GARDNER, SANDRA J</au><au>ISGANITIS, LOUIS V</au><au>NG, TIE HWEE</au><au>PATEL, RAJ D</au><au>DRAPPEL, STEPHAN V</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>TONER HAVING CRYSTALLINE WAX</title><date>2010-09-28</date><risdate>2010</risdate><abstract>Embodiments include a toner with a distilled wax having a crystallinity of from about 55 to about 100 percent, wherein the degree of crystallinity is calculated using the following formulas: [Heat of enthalpy (Hm) J/g / 294 J/g] × 100 = degree of crystallinity (Xc); [Heat of recrystallization (Hrc) J/g / 294 J/g] × 100 = degree of crystallinity (Xc); and Sc/(Sc+Sa)] × 100%, wherein Sc is a diffraction peak area of a crystalline component of the wax and the Sa is a diffraction peak area of an amorphous component of the wax; and wherein the Mp, Mn and Mw of the wax are all within the range of from about 500 to about 800, and wherein the wax has a polydispersity of from about 1 to about 1.05.
Parmi les réalisations, on retrouve une encre en poudre avec une cire distillée ayant une cristallinité d'environ 55 à environ 100 pour cent, dans laquelle le degré de cristallinité est calculé au moyen des formules suivantes : ¬Chaleur d'enthalpie (Hm) J/g /294 J/g| .fois. 100 = degré de crystallinité (Xc); ¬Chaleur de recristallisation (Hrc) J/g /294 J/g| .fois. 100 = degré de cristallinité (Xc); Sc/(Sc+Sa)| .fois. 100 %, dans laquelle Sc est la surface d'un pic de diffraction d'un composant cristallin de la cire et Sa est la surface d'un pic de diffraction d'un composant amorphe de la cire; et où Mp, Mn et Mw de la cire sont tous dans la gamme allant d'environ 500 à environ 800, et dans laquelle la cire a une polydispersité d'environ 1 à environ 1,05.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | CINEMATOGRAPHY ELECTROGRAPHY ELECTROPHOTOGRAPHY HOLOGRAPHY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MAGNETOGRAPHY MEASURING PHOTOGRAPHY PHYSICS TESTING |
| title | TONER HAVING CRYSTALLINE WAX |
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