METHOD FOR LOCATING DEFECTIVE POINTS AND MARKING SYSTEM
The invention relates to a method and marking system for locating defective points on a three-dimensional object (2), particularly the lacquered bodywor k of a vehicle, wherein the defective points are detected and located by means of an optical capture device (3,4). The aim of the invention is to l...
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Patent |
| Sprache: | eng ; fre |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | WIENAND, STEPHAN KNOCHE, HORST ERSUE, ENIS |
| description | The invention relates to a method and marking system for locating defective points on a three-dimensional object (2), particularly the lacquered bodywor k of a vehicle, wherein the defective points are detected and located by means of an optical capture device (3,4). The aim of the invention is to locate a defective point in a highly precise manner. According to the invention, the construction data (CAD data) of the object (2), and the optical imaging properties of the capture device (3,4) and the object (2) are known during t he recording of the image and the location of the error is determined on the object therefrom and is optionally marked with a spray head. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CA2556042A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CA2556042A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CA2556042A13</originalsourceid><addsrcrecordid>eNrjZDD3dQ3x8HdRcPMPUvDxd3YM8fRzV3BxdXN1DvEMc1UI8Pf0CwlWcPRzUfB1DPIGSQZHBoe4-vIwsKYl5hSn8kJpbgYFN9cQZw_d1IL8-NTigsTk1LzUknhnRyNTUzMDEyNHQ2MilAAA4qonmg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>METHOD FOR LOCATING DEFECTIVE POINTS AND MARKING SYSTEM</title><source>esp@cenet</source><creator>WIENAND, STEPHAN ; KNOCHE, HORST ; ERSUE, ENIS</creator><creatorcontrib>WIENAND, STEPHAN ; KNOCHE, HORST ; ERSUE, ENIS</creatorcontrib><description>The invention relates to a method and marking system for locating defective points on a three-dimensional object (2), particularly the lacquered bodywor k of a vehicle, wherein the defective points are detected and located by means of an optical capture device (3,4). The aim of the invention is to locate a defective point in a highly precise manner. According to the invention, the construction data (CAD data) of the object (2), and the optical imaging properties of the capture device (3,4) and the object (2) are known during t he recording of the image and the location of the error is determined on the object therefrom and is optionally marked with a spray head.</description><language>eng ; fre</language><subject>CALCULATING ; COMPUTING ; COUNTING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2005</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20050929&DB=EPODOC&CC=CA&NR=2556042A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76516</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20050929&DB=EPODOC&CC=CA&NR=2556042A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>WIENAND, STEPHAN</creatorcontrib><creatorcontrib>KNOCHE, HORST</creatorcontrib><creatorcontrib>ERSUE, ENIS</creatorcontrib><title>METHOD FOR LOCATING DEFECTIVE POINTS AND MARKING SYSTEM</title><description>The invention relates to a method and marking system for locating defective points on a three-dimensional object (2), particularly the lacquered bodywor k of a vehicle, wherein the defective points are detected and located by means of an optical capture device (3,4). The aim of the invention is to locate a defective point in a highly precise manner. According to the invention, the construction data (CAD data) of the object (2), and the optical imaging properties of the capture device (3,4) and the object (2) are known during t he recording of the image and the location of the error is determined on the object therefrom and is optionally marked with a spray head.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2005</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDD3dQ3x8HdRcPMPUvDxd3YM8fRzV3BxdXN1DvEMc1UI8Pf0CwlWcPRzUfB1DPIGSQZHBoe4-vIwsKYl5hSn8kJpbgYFN9cQZw_d1IL8-NTigsTk1LzUknhnRyNTUzMDEyNHQ2MilAAA4qonmg</recordid><startdate>20050929</startdate><enddate>20050929</enddate><creator>WIENAND, STEPHAN</creator><creator>KNOCHE, HORST</creator><creator>ERSUE, ENIS</creator><scope>EVB</scope></search><sort><creationdate>20050929</creationdate><title>METHOD FOR LOCATING DEFECTIVE POINTS AND MARKING SYSTEM</title><author>WIENAND, STEPHAN ; KNOCHE, HORST ; ERSUE, ENIS</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CA2556042A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre</language><creationdate>2005</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>WIENAND, STEPHAN</creatorcontrib><creatorcontrib>KNOCHE, HORST</creatorcontrib><creatorcontrib>ERSUE, ENIS</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>WIENAND, STEPHAN</au><au>KNOCHE, HORST</au><au>ERSUE, ENIS</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD FOR LOCATING DEFECTIVE POINTS AND MARKING SYSTEM</title><date>2005-09-29</date><risdate>2005</risdate><abstract>The invention relates to a method and marking system for locating defective points on a three-dimensional object (2), particularly the lacquered bodywor k of a vehicle, wherein the defective points are detected and located by means of an optical capture device (3,4). The aim of the invention is to locate a defective point in a highly precise manner. According to the invention, the construction data (CAD data) of the object (2), and the optical imaging properties of the capture device (3,4) and the object (2) are known during t he recording of the image and the location of the error is determined on the object therefrom and is optionally marked with a spray head.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng ; fre |
| recordid | cdi_epo_espacenet_CA2556042A1 |
| source | esp@cenet |
| subjects | CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | METHOD FOR LOCATING DEFECTIVE POINTS AND MARKING SYSTEM |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-13T10%3A13%3A41IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=WIENAND,%20STEPHAN&rft.date=2005-09-29&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECA2556042A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |