A METHOD AND APPARATUS FOR CREATING PERFORMANCE LIMITS FROM PARAMETRIC MEASUREMENTS
A measurement device includes a measurement circuit that generates a parametric measurement data signal including parametric characteristics of an input signal. In an exemplary embodiment, the parametric characteristics are measured at predetermined increments of time. A population limit analyzer is...
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| creator | WASCHURA, THOMAS E WASCHURA, JAMES R |
| description | A measurement device includes a measurement circuit that generates a parametric measurement data signal including parametric characteristics of an input signal. In an exemplary embodiment, the parametric characteristics are measured at predetermined increments of time. A population limit analyzer is coupled to the measurement circuit and generates limit data in response to the parametric measurement data signal. A measurement limit checker is coupled to the population limit analyzer and generates a signal indicating that the characteristics of the parametric measurement data signal is within acceptable limits. With this information, the user is able to quickly grade a selected device under test (DUT). A device performance measurement method includes receiving an input signal. Next, statistical characteristics are determined from the parametric measurements of the input signal. Performance limits are extrapolated from the statistical characteristics of the parametric measurements. Then, a determination is made as to whether the parametric measurements are within the extrapolated performance limits. |
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In an exemplary embodiment, the parametric characteristics are measured at predetermined increments of time. A population limit analyzer is coupled to the measurement circuit and generates limit data in response to the parametric measurement data signal. A measurement limit checker is coupled to the population limit analyzer and generates a signal indicating that the characteristics of the parametric measurement data signal is within acceptable limits. With this information, the user is able to quickly grade a selected device under test (DUT). A device performance measurement method includes receiving an input signal. Next, statistical characteristics are determined from the parametric measurements of the input signal. Performance limits are extrapolated from the statistical characteristics of the parametric measurements. Then, a determination is made as to whether the parametric measurements are within the extrapolated performance limits.</description><edition>7</edition><language>eng ; fre</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC COMMUNICATION TECHNIQUE ; ELECTRIC DIGITAL DATA PROCESSING ; ELECTRICITY ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING ; TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION</subject><creationdate>2005</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20050802&DB=EPODOC&CC=CA&NR=2495775A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20050802&DB=EPODOC&CC=CA&NR=2495775A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>WASCHURA, THOMAS E</creatorcontrib><creatorcontrib>WASCHURA, JAMES R</creatorcontrib><title>A METHOD AND APPARATUS FOR CREATING PERFORMANCE LIMITS FROM PARAMETRIC MEASUREMENTS</title><description>A measurement device includes a measurement circuit that generates a parametric measurement data signal including parametric characteristics of an input signal. In an exemplary embodiment, the parametric characteristics are measured at predetermined increments of time. A population limit analyzer is coupled to the measurement circuit and generates limit data in response to the parametric measurement data signal. A measurement limit checker is coupled to the population limit analyzer and generates a signal indicating that the characteristics of the parametric measurement data signal is within acceptable limits. With this information, the user is able to quickly grade a selected device under test (DUT). A device performance measurement method includes receiving an input signal. Next, statistical characteristics are determined from the parametric measurements of the input signal. Performance limits are extrapolated from the statistical characteristics of the parametric measurements. Then, a determination is made as to whether the parametric measurements are within the extrapolated performance limits.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC COMMUNICATION TECHNIQUE</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><subject>TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2005</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZAh2VPB1DfHwd1Fw9APigADHIMeQ0GAFN_8gBecgV8cQTz93hQDXICDf19HP2VXBx9PXMwQoH-TvqwBSDNQd5OkMNMQxODTI1dfVLySYh4E1LTGnOJUXSnMzKLi5hjh76KYW5MenFhckJqfmpZbEOzsamViampubOhoaE6EEAJjaL4E</recordid><startdate>20050802</startdate><enddate>20050802</enddate><creator>WASCHURA, THOMAS E</creator><creator>WASCHURA, JAMES R</creator><scope>EVB</scope></search><sort><creationdate>20050802</creationdate><title>A METHOD AND APPARATUS FOR CREATING PERFORMANCE LIMITS FROM PARAMETRIC MEASUREMENTS</title><author>WASCHURA, THOMAS E ; WASCHURA, JAMES R</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CA2495775A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre</language><creationdate>2005</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC COMMUNICATION TECHNIQUE</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><topic>TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION</topic><toplevel>online_resources</toplevel><creatorcontrib>WASCHURA, THOMAS E</creatorcontrib><creatorcontrib>WASCHURA, JAMES R</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>WASCHURA, THOMAS E</au><au>WASCHURA, JAMES R</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>A METHOD AND APPARATUS FOR CREATING PERFORMANCE LIMITS FROM PARAMETRIC MEASUREMENTS</title><date>2005-08-02</date><risdate>2005</risdate><abstract>A measurement device includes a measurement circuit that generates a parametric measurement data signal including parametric characteristics of an input signal. In an exemplary embodiment, the parametric characteristics are measured at predetermined increments of time. A population limit analyzer is coupled to the measurement circuit and generates limit data in response to the parametric measurement data signal. A measurement limit checker is coupled to the population limit analyzer and generates a signal indicating that the characteristics of the parametric measurement data signal is within acceptable limits. With this information, the user is able to quickly grade a selected device under test (DUT). A device performance measurement method includes receiving an input signal. Next, statistical characteristics are determined from the parametric measurements of the input signal. Performance limits are extrapolated from the statistical characteristics of the parametric measurements. Then, a determination is made as to whether the parametric measurements are within the extrapolated performance limits.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
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| language | eng ; fre |
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| subjects | CALCULATING COMPUTING COUNTING ELECTRIC COMMUNICATION TECHNIQUE ELECTRIC DIGITAL DATA PROCESSING ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION |
| title | A METHOD AND APPARATUS FOR CREATING PERFORMANCE LIMITS FROM PARAMETRIC MEASUREMENTS |
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