METHOD AND ARRANGEMENT IN A MEASURING SYSTEM

The present invention relates to a method and an arrangement for representin g the characteristics of an object (3) by means of a measuring system, in whic h either the measuring system or the object (3) is designed to move in relatio n to one another in a predefined direction of movement, the objec...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	ASTROEM, ANDERS, ASTRAND, ERIK
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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