DEVICE FOR MEASUREMENT OF METAL SHEET THICKNESS AND CLAD LAYER THICKNESS AND USE OF THE DEVICE

The invention refers to a device for measurement of the thickness of a first layer, comprising one or more sublayers, on a second layer of a metal sheet by X-ray fluorescence analysis comprising means for generating and directing a beam of polychromatic primary X-rays, said beam being able to penetr...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	HASZLER, ALFRED JOHANN PETER, GHAZIARY, HORMOZ
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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