METHOD AND APPARATUS FOR IN-SITU TESTING OF INTEGRATED CIRCUIT CHIPS

A method of testing semiconductor chips is disclosed. The individual semiconductor chips have I/O, power, and ground contacts. In the method of the invention a chip carrier is provided. The chip carrier has contacts corresponding to the contacts on the semiconductor chip. The carrier contacts have d...

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Bibliographische Detailangaben

Hauptverfasser:	EDWARDS, ROBERT DOUGLAS, MARKOVICH, VOYA RISTA, HART, PAUL JOSEPH, WHALEN, BETTE JAYE, ZARR, RICHARD STUART, MOLLA, JAYNAL ABEDIN, INGRAHAM,, ANTHONY PAUL, MURPHY, RICHARD GERALD, SAXENMEYER, GEORGE JOHN, JR, WALKER, GEORGE FREDERICK, BUDA, LEO RAYMOND, BHATT, ANILKUMAR CHINUPRASAD
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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