método para estimar uma espessura de uma camada geológica, programa de computador, e, mídia legível por computador
The invention is a method of estimating thickness of a geological layer (L), the method comprising the steps of: (a) selecting seismic reflection field data from a subsurface depth interval of interest; (b) providing a plurality of geological modelshaving different layer thicknesses and providing re...
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| creator | ESPEN OEN LIE |
| description | The invention is a method of estimating thickness of a geological layer (L), the method comprising the steps of: (a) selecting seismic reflection field data from a subsurface depth interval of interest; (b) providing a plurality of geological modelshaving different layer thicknesses and providing respective model responses from the plurality of geological models; (c) comparing a frequency spectrum of the seismic reflection field data with each of the frequency spectra of the model responses to derive comparison data associated with the different layer thicknesses of the models; and (d) deriving from the comparison data a model layer thickness that is indicative of the thickness of the geological layer. |
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| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_BRPI0918037A2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>BRPI0918037A2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_BRPI0918037A23</originalsourceid><addsrcrecordid>eNqNjT0KwkAQRtNYiHqHwTpCNIVaqijaidiHYXeyBHadZX9yJ4tUHmEvZiIWllbf4_HgG2etSc_AksGiQyAfGoMOohnYkvext5I-QqBBiaCIdXqpRmAO1rFyvR4SwcbGgJJdDpSDSZ1sEDSp1LWkwbL7SabZqEbtafbdSTY_He-H84IsV_0zCnpQqPa366XYLjdFud6tyr-iN9sOSF8</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>método para estimar uma espessura de uma camada geológica, programa de computador, e, mídia legível por computador</title><source>esp@cenet</source><creator>ESPEN OEN LIE</creator><creatorcontrib>ESPEN OEN LIE</creatorcontrib><description>The invention is a method of estimating thickness of a geological layer (L), the method comprising the steps of: (a) selecting seismic reflection field data from a subsurface depth interval of interest; (b) providing a plurality of geological modelshaving different layer thicknesses and providing respective model responses from the plurality of geological models; (c) comparing a frequency spectrum of the seismic reflection field data with each of the frequency spectra of the model responses to derive comparison data associated with the different layer thicknesses of the models; and (d) deriving from the comparison data a model layer thickness that is indicative of the thickness of the geological layer.</description><language>por</language><subject>DETECTING MASSES OR OBJECTS ; GEOPHYSICS ; GRAVITATIONAL MEASUREMENTS ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2015</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20151201&DB=EPODOC&CC=BR&NR=PI0918037A2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25551,76302</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20151201&DB=EPODOC&CC=BR&NR=PI0918037A2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ESPEN OEN LIE</creatorcontrib><title>método para estimar uma espessura de uma camada geológica, programa de computador, e, mídia legível por computador</title><description>The invention is a method of estimating thickness of a geological layer (L), the method comprising the steps of: (a) selecting seismic reflection field data from a subsurface depth interval of interest; (b) providing a plurality of geological modelshaving different layer thicknesses and providing respective model responses from the plurality of geological models; (c) comparing a frequency spectrum of the seismic reflection field data with each of the frequency spectra of the model responses to derive comparison data associated with the different layer thicknesses of the models; and (d) deriving from the comparison data a model layer thickness that is indicative of the thickness of the geological layer.</description><subject>DETECTING MASSES OR OBJECTS</subject><subject>GEOPHYSICS</subject><subject>GRAVITATIONAL MEASUREMENTS</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2015</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjT0KwkAQRtNYiHqHwTpCNIVaqijaidiHYXeyBHadZX9yJ4tUHmEvZiIWllbf4_HgG2etSc_AksGiQyAfGoMOohnYkvext5I-QqBBiaCIdXqpRmAO1rFyvR4SwcbGgJJdDpSDSZ1sEDSp1LWkwbL7SabZqEbtafbdSTY_He-H84IsV_0zCnpQqPa366XYLjdFud6tyr-iN9sOSF8</recordid><startdate>20151201</startdate><enddate>20151201</enddate><creator>ESPEN OEN LIE</creator><scope>EVB</scope></search><sort><creationdate>20151201</creationdate><title>método para estimar uma espessura de uma camada geológica, programa de computador, e, mídia legível por computador</title><author>ESPEN OEN LIE</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_BRPI0918037A23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>por</language><creationdate>2015</creationdate><topic>DETECTING MASSES OR OBJECTS</topic><topic>GEOPHYSICS</topic><topic>GRAVITATIONAL MEASUREMENTS</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>ESPEN OEN LIE</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ESPEN OEN LIE</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>método para estimar uma espessura de uma camada geológica, programa de computador, e, mídia legível por computador</title><date>2015-12-01</date><risdate>2015</risdate><abstract>The invention is a method of estimating thickness of a geological layer (L), the method comprising the steps of: (a) selecting seismic reflection field data from a subsurface depth interval of interest; (b) providing a plurality of geological modelshaving different layer thicknesses and providing respective model responses from the plurality of geological models; (c) comparing a frequency spectrum of the seismic reflection field data with each of the frequency spectra of the model responses to derive comparison data associated with the different layer thicknesses of the models; and (d) deriving from the comparison data a model layer thickness that is indicative of the thickness of the geological layer.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | DETECTING MASSES OR OBJECTS GEOPHYSICS GRAVITATIONAL MEASUREMENTS MEASURING PHYSICS TESTING |
| title | método para estimar uma espessura de uma camada geológica, programa de computador, e, mídia legível por computador |
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